Bayesian reliability assessment and degradation modeling with calibrations and random failure threshold

2016 ◽  
Vol 21 (4) ◽  
pp. 478-483 ◽  
Author(s):  
Jinbo Huang ◽  
Dejing Kong ◽  
Lirong Cui
Keyword(s):  
Reliability Assessment ◽  
Degradation Modeling ◽  
Random Failure ◽  
Random Failure Threshold

Remaining useful life estimation based on Wiener degradation processes with random failure threshold

2016 ◽  
Vol 23 (9) ◽  
pp. 2230-2241 ◽  
Author(s):  
Sheng-jin Tang ◽  
Chuan-qiang Yu ◽  
Yong-bao Feng ◽  
Jian Xie ◽  
Qin-he Gao ◽  
...  
Keyword(s):  
Remaining Useful Life ◽  
Life Estimation ◽  
Degradation Processes ◽  
Random Failure ◽  
Useful Life ◽  
Random Failure Threshold

scholarly journals Reliability Estimation Based on the Degradation Amount Distribution Using Composite Time Series Analysis and Grey Theory

2013 ◽  
Vol 13 (3) ◽  
pp. 3-14
Author(s):  
Li Wang, ◽  
Zaiwen Liu ◽  
Xuebo Jin ◽  
Yan Shi
Keyword(s):  
Time Series ◽  
Time Series Analysis ◽  
Estimation Method ◽  
Reliability Evaluation ◽  
Reliability Estimation ◽  
Grey Theory ◽  
Series Analysis ◽  
Electronic Product ◽  
Random Failure ◽  
Random Failure Threshold

Abstract This paper puts forward a reliability estimation method by the Degradation Amount Distribution (DAD) of products, using a composite time series modeling procedure and grey theory based on a random failure threshold. Product DAD data are treated as a composite time series and described using a composite time series model to predict a long-term trend of degradation. The degradation test is processed for a certain electronic product and the degradation data is collected for reliability estimation. Comparison among the reliability evaluation by DAD composite time series analysis and grey theory, based on a constant and a random failure threshold, reliability evaluation by DAD regression analysis based on a random failure threshold, reliability evaluation by degradation path time series analysis, and real reliability of the electronic product is done. The results show that the reliability evaluation of the product using the method proposed is the most creditable of all.

On dynamic information-based life extension

2020 ◽  
pp. 1748006X2098065
Author(s):  
Maxim Finkelstein ◽  
Ji Hwan Cha ◽  
Shyamal Ghosh
Keyword(s):  
Preventive Maintenance ◽  
Life Extension ◽  
Optimal Decision ◽  
Optimal Solutions ◽  
Dynamic Information ◽  
Numerical Examples ◽  
Random Failure ◽  
Random Failure Threshold

When the level of degradation of a deteriorating system is observed at inspection, a decision can be made either to perform its preventive maintenance (PM) immediately or to postpone it. This type of policy can increase the expected lifetime of a system if executed in an optimal way. The main distinction from the previous works is that for optimal decision, we utilise the information on degradation, which enables to use optimally resources of a system. The case of one possible PM with the deterministic failure threshold is considered in detail. Generalisations to the cases of imperfect PM, several PMs and of a random failure threshold are discussed. The obtained optimal solutions are illustrated by numerical examples.

scholarly journals Methods for predicting the remaining useful life of equipment in consideration of the random failure threshold

2020 ◽  
Vol 31 (2) ◽  
pp. 415-431 ◽  
Author(s):  
Zezhou Wang ◽  
Yunxiang Chen ◽  
Zhongyi Cai ◽  
Yangjun Gao ◽  
Lili Wang
Keyword(s):  
Remaining Useful Life ◽  
Random Failure ◽  
Useful Life ◽  
Random Failure Threshold

Degradation Modeling and Reliability Assessment of Capacitors

2019 ◽  
Author(s):  
Anunay Gupta ◽  
Om Prakash Yadav ◽  
Arighna Roy ◽  
Douglas DeVoto ◽  
Joshua Major
Keyword(s):  
Stochastic Process ◽  
Reliability Assessment ◽  
Likelihood Estimation ◽  
Model Parameters ◽  
Degradation Behavior ◽  
Temporal Uncertainty ◽  
Extrinsic Factors ◽  
Physics Of Failure ◽  
Degradation Modeling ◽  
Failure Models

Abstract The degradation of capacitors under accelerated stress conditions occur in a monotonic and non-linear fashion. Several efforts have been made to model the degradation behavior of capacitor considering either physics-of-failure models or statistical models and subsequently estimate its reliability and lifetime parameters. But most of these models fail to reflect the physical properties of the degradation path, which varies according to several intrinsic and extrinsic factors. These factors introduce random and temporal uncertainty among the population of capacitors. The gamma stochastic process can model both type of uncertainties among the population of capacitors. In this paper, we model the capacitor degradation by non-homogeneous gamma stochastic process in which both the model parameters (shape and scale) are dependent on stress variables. The model parameters are estimated using the maximum likelihood estimation approach.

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