refracted near-field scanning method

Author(s):  
Jeff Dunnihoo ◽  
Pasi Tamminen ◽  
Toni Viheriäkoski

Abstract In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.


2007 ◽  
Vol 49 (2) ◽  
pp. 391-400 ◽  
Author(s):  
Yolanda Vives-Gilabert ◽  
Christian Arcambal ◽  
Anne Louis ◽  
Franois de Daran ◽  
Philippe Eudeline ◽  
...  

1986 ◽  
Vol 23 (3) ◽  
pp. 197-210
Author(s):  
A. Owens

An undergraduate experiment, of approximately six hours duration, is presented, in which the refractive index profile of a graded index fibre is measured using the near-field scanning method. The numerical aperture is obtained from far-field measurements and the core and cladding diameters are measured directly using an optical bench microscope and stage micrometer.


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