Time-domain measurements using near field scanning method for fast transient current reconstruction

2017 ◽  
Author(s):  
Bertrand Vrignon ◽  
Kamel Abouda ◽  
Adrien Doridant ◽  
Nicolas Baptistat
Keyword(s):  
Time Domain ◽  
Near Field ◽  
Transient Current ◽  
Scanning Method ◽  
Fast Transient ◽  
Near Field Scanning ◽  
Current Reconstruction

Near Field EMC Scanning Method Based on an E-Field Collapse

2015 ◽  
Author(s):  
Jeff Dunnihoo ◽  
Pasi Tamminen ◽  
Toni Viheriäkoski
Keyword(s):  
Near Field ◽  
Electronic Systems ◽  
Inexpensive Method ◽  
Scanning Method ◽  
Field Information ◽  
Novel Method ◽  
Near Field Scanning

Abstract In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.

scholarly journals An Iterative Interpolated DFT to Remove Spectral Leakage in Time-Domain Near-Field Scanning

2018 ◽  
Vol 60 (1) ◽  
pp. 202-210 ◽  
Author(s):  
Tim Claeys ◽  
Dries Vanoost ◽  
Joan Peuteman ◽  
Guy A. E. Vandenbosch ◽  
Davy Pissoort
Keyword(s):  
Time Domain ◽  
Near Field ◽  
Spectral Leakage ◽  
Near Field Scanning

Near-field scanning optical microscopy local luminescence studies of rhodamine dye

Open Physics ◽  
2010 ◽  
Vol 8 (3) ◽  
Author(s):  
Petr Klapetek ◽  
Juraj Bujdák ◽  
Jiří Buršík
Keyword(s):  
Time Domain ◽  
Near Field ◽  
Optical Microscope ◽  
Far Field ◽  
Luminescence Signal ◽  
Local Topography ◽  
Field Radiation ◽  
Scanning Optical Microscopy ◽  
Rhodamine Dye ◽  
Near Field Scanning

AbstractThis article presents results of near-field scanning optical microscope measurement of local luminescence of rhodamine 3B intercalated in montmorillonite samples. We focus on how local topography affects both the excitation and luminescence signals and resulting optical artifacts. The Finite Difference in Time Domain method (FDTD) is used to model the electromagnetic field distribution of the full tip-sample geometry including far-field radiation. Even complex problems like localized luminescence can be simulated computationally using FDTD and these simulations can be used to separate the luminescence signal from topographic artifacts.

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