Near Field EMC Scanning Method Based on an E-Field Collapse

2015 ◽  
Author(s):  
Jeff Dunnihoo ◽  
Pasi Tamminen ◽  
Toni Viheriäkoski
Keyword(s):  
Near Field ◽  
Electronic Systems ◽  
Inexpensive Method ◽  
Scanning Method ◽  
Field Information ◽  
Novel Method ◽  
Near Field Scanning

Abstract In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.

Modeling Magnetic Radiations of Electronic Circuits Using Near-Field Scanning Method

2007 ◽  
Vol 49 (2) ◽  
pp. 391-400 ◽  
Author(s):  
Yolanda Vives-Gilabert ◽  
Christian Arcambal ◽  
Anne Louis ◽  
Franois de Daran ◽  
Philippe Eudeline ◽  
...  
Keyword(s):  
Near Field ◽  
Electronic Circuits ◽  
Scanning Method ◽  
Near Field Scanning

A Laboratory Investigation into the Measurement of Optical Fibre Parameters

1986 ◽  
Vol 23 (3) ◽  
pp. 197-210
Author(s):  
A. Owens
Keyword(s):  
Near Field ◽  
Numerical Aperture ◽  
Field Measurements ◽  
Refractive Index Profile ◽  
Index Profile ◽  
Scanning Method ◽  
Graded Index ◽  
The Core ◽  
Index Fibre ◽  
Near Field Scanning

An undergraduate experiment, of approximately six hours duration, is presented, in which the refractive index profile of a graded index fibre is measured using the near-field scanning method. The numerical aperture is obtained from far-field measurements and the core and cladding diameters are measured directly using an optical bench microscope and stage micrometer.

scholarly journals Detection of Anti-Counterfeiting Markers through Permittivity Maps Using a Micrometer Scale near Field Scanning Microwave Microscope

Sensors ◽  
2021 ◽  
Vol 21 (16) ◽  
pp. 5463
Author(s):  
José D. Gutiérrez-Cano ◽  
José M. Catalá-Civera ◽  
Pedro J. Plaza-González ◽  
Felipe L. Peñaranda-Foix
Keyword(s):  
Perturbation Technique ◽  
Near Field ◽  
New Approach ◽  
Microwave Technique ◽  
Resonance Response ◽  
Microwave Microscope ◽  
Novel Method ◽  
Micrometer Scale ◽  
The Relationship ◽  
Near Field Scanning

This paper describes the use of microwave technology to identify anti-counterfeiting markers on banknotes. The proposed method is based on a robust near-field scanning microwave microscope specially developed to measure permittivity maps of heterogeneous paper specimens at the micrometer scale. The equipment has a built-in vector network analyzer to measure the reflection response of a near-field coaxial probe, which makes it a standalone and portable device. A new approach employing the information of a displacement laser and the cavity perturbation technique was used to determine the relationship between the dielectric properties of the specimens and the resonance response of the probe, avoiding the use of distance-following techniques. The accuracy of the dielectric measurements was evaluated through a comparative study with other well-established cavity methods, revealing uncertainties lower than 5%, very similar to the accuracy reported by other more sophisticated setups. The device was employed to determine the dielectric map of a watermark on a 20 EUR banknote. In addition, the penetration capabilities of microwave energy allowed for the detection of the watermark when concealed behind dielectric or metallic layers. This work demonstrates the benefits of this microwave technique as a novel method for identifying anti-counterfeiting features, which opens new perspectives with which to develop optically opaque markers only traceable through this microwave technique.

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