Electron energy loss spectroscopy studies of CoCrTaPt/Cr thin films for high-density longitudinal magnetic recording media

Kyusik Sin; Pawel Glijer; John M. Sivertsen; Jack H. Judy

doi:10.1016/0304-8853(95)00739-3

Electron energy loss spectroscopy studies of CoCrTaPt/Cr thin films for high-density longitudinal magnetic recording media

Journal of Magnetism and Magnetic Materials ◽

10.1016/0304-8853(95)00739-3 ◽

1996 ◽

Vol 155 (1-3) ◽

pp. 209-211 ◽

Cited By ~ 5

Author(s):

Kyusik Sin ◽

Pawel Glijer ◽

John M. Sivertsen ◽

Jack H. Judy

Keyword(s):

Thin Films ◽

Energy Loss ◽

Electron Energy ◽

Magnetic Recording ◽

Electron Energy Loss Spectroscopy ◽

High Density ◽

Recording Media ◽

Magnetic Recording Media ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Auger and electron energy loss spectroscopy studies of AlN and (AlN)x(Al2O3)1−x thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578126 ◽

1992 ◽

Vol 10 (1) ◽

pp. 137-144 ◽

Cited By ~ 11

Author(s):

R. Shinar

Keyword(s):

Thin Films ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Spectroscopy Studies ◽

Electron Energy Loss

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ChemInform Abstract: Adsorption and Reaction of Formic Acid on NiO(100) Films on Mo(100): Temperature Programmed Desorption and High Resolution Electron Energy Loss Spectroscopy Studies.

ChemInform ◽

10.1002/chin.199317036 ◽

2010 ◽

Vol 24 (17) ◽

pp. no-no

Author(s):

C. M. TRUONG ◽

M.-C. WU ◽

D. W. GOODMAN

Keyword(s):

High Resolution ◽

Energy Loss ◽

Formic Acid ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Temperature Programmed Desorption ◽

Resolution Electron ◽

Temperature Programmed ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Oxygen incorporation in Ti2AlC thin films studied by electron energy loss spectroscopy and ab initio calculations

Journal of Materials Science ◽

10.1007/s10853-013-7165-4 ◽

2013 ◽

Vol 48 (10) ◽

pp. 3686-3691 ◽

Cited By ~ 12

Author(s):

A. Mockute ◽

M. Dahlqvist ◽

L. Hultman ◽

P. O. Å. Persson ◽

J. Rosen

Keyword(s):

Thin Films ◽

Energy Loss ◽

Ab Initio Calculations ◽

Ab Initio ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Oxygen Incorporation ◽

Electron Energy Loss

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Effects of microstructure on the optical properties of tin-doped indium oxide thin films studied by electron energy loss spectroscopy

Materials Letters ◽

10.1016/0167-577x(95)00189-1 ◽

1995 ◽

Vol 25 (5-6) ◽

pp. 217-222 ◽

Cited By ~ 16

Author(s):

I.A. Rauf ◽

J. Yuan

Keyword(s):

Thin Films ◽

Optical Properties ◽

Energy Loss ◽

Electron Energy ◽

Indium Oxide ◽

Electron Energy Loss Spectroscopy ◽

Oxide Thin Films ◽

Electron Energy Loss

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High-resolution electron-energy-loss spectroscopy studies of GaAs (100) surfaces

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.583738 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1113 ◽

Cited By ~ 119

Author(s):

D. J. Frankel

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Resolution Electron ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Electron-energy-loss spectroscopy studies of Cu-α-Al2O3interfaces grown by molecular beam epitaxy

Philosophical Magazine A ◽

10.1080/01418619808241913 ◽

1998 ◽

Vol 78 (2) ◽

pp. 439-465 ◽

Cited By ~ 58

Author(s):

C. Scheu ◽

G. Dehm ◽

M. Rühle ◽

R. Brydson

Keyword(s):

Molecular Beam Epitaxy ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Molecular Beam ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Quantification of the H content in diamondlike carbon and polymeric thin films by reflection electron energy loss spectroscopy

Applied Physics Letters ◽

10.1063/1.2011786 ◽

2005 ◽

Vol 87 (8) ◽

pp. 084101 ◽

Cited By ~ 47

Author(s):

F. Yubero ◽

V. J. Rico ◽

J. P. Espinós ◽

J. Cotrino ◽

A. R. González-Elipe

Keyword(s):

Thin Films ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Polymeric Thin Films ◽

Diamondlike Carbon ◽

Electron Energy Loss

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High resolution electron energy loss spectroscopy study of Fomblin Z-tetraol thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1861052 ◽

2005 ◽

Vol 23 (2) ◽

pp. 316-321

Author(s):

Dougyong Sung ◽

Andrew J. Gellman ◽

Jing Gui ◽

Xiaoding Ma

Keyword(s):

Thin Films ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Spectroscopy Study ◽

Resolution Electron ◽

Fomblin Z ◽

Electron Energy Loss

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Electron States of 1:2 Addition Compounds of TiCl4with Diethyl Ether and Diethyl Sulfide: HeI Photoelectron and Electron Energy Loss Spectroscopy Studies†

The Journal of Physical Chemistry A ◽

10.1021/jp962651g ◽

1997 ◽

Vol 101 (9) ◽

pp. 1680-1683 ◽

Cited By ~ 2

Author(s):

S. P. Ananthavel ◽

M. S. Hegde

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Diethyl Ether ◽

Electron Energy Loss Spectroscopy ◽

Diethyl Sulfide ◽

Electron States ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Electron Energy Loss Spectroscopy Studies of Carbynoid Structures

Physics and Chemistry of Materials with Low-Dimensional Structures - Carbyne and Carbynoid Structures ◽

10.1007/978-94-011-4742-2_26 ◽

1999 ◽

pp. 395-407 ◽

Cited By ~ 1

Author(s):

Jacob I. Kleiman

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Spectroscopy Studies ◽

Electron Energy Loss

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