A transmission electron microscope study of metal/chalcogenide amorphous thin films

J.S Romero; A.G Fitzgerald; M.J Rose

doi:10.1016/j.apsusc.2004.05.039

A transmission electron microscope study of metal/chalcogenide amorphous thin films

Applied Surface Science ◽

10.1016/j.apsusc.2004.05.039 ◽

2004 ◽

Vol 234 (1-4) ◽

pp. 369-373 ◽

Cited By ~ 7

Author(s):

J.S Romero ◽

A.G Fitzgerald ◽

M.J Rose

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Metal Chalcogenide ◽

Amorphous Thin Films ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Transmission electron microscope study of ion beam induced interfacial reactions in molybdenum thin films on silicon

Applications of Surface Science ◽

10.1016/0378-5963(82)90067-8 ◽

1982 ◽

Vol 11-12 ◽

pp. 202-208 ◽

Cited By ~ 8

Author(s):

L.J. Chen ◽

L.S. Hung ◽

J.W. Mayer

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Ion Beam ◽

Interfacial Reactions ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Transmission electron microscope study of the crystal structures and microstructures of ZrSi and HfSi in ultrahigh vacuum deposited metal thin films on (111)Si

Journal of Applied Physics ◽

10.1063/1.357141 ◽

1994 ◽

Vol 76 (1) ◽

pp. 278-284 ◽

Cited By ~ 7

Author(s):

W. Y. Hseih ◽

L. J. Chen

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Crystal Structures ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Metal Thin Films ◽

Transmission Electron ◽

Deposited Metal ◽

Transmission Electron Microscope Study

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Transmission electron microscope study of ion and electron beam induced structural changes ina‐Ge0.25Se0.75inorganic resist thin films

Journal of Applied Physics ◽

10.1063/1.331405 ◽

1982 ◽

Vol 53 (8) ◽

pp. 5975-5978 ◽

Cited By ~ 4

Author(s):

K. Balasubramanyam ◽

L. J. Chen ◽

A. L. Ruoff ◽

E. D. Wolf

Keyword(s):

Thin Films ◽

Electron Beam ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Structural Changes ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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A Transmission Electron Microscope Study of the Chalcocite–Djurleite Transformation in Topotactically Grown Thin Films of CuxS

phys stat sol (a) ◽

10.1002/pssa.2210720131 ◽

1982 ◽

Vol 72 (1) ◽

pp. 305-311 ◽

Cited By ~ 4

Author(s):

J. Echigoya ◽

J. W. Edington

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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A transmission electron microscope study of microstructural development in magnetron-sputtered MoSi2 thin films

Intermetallics ◽

10.1016/s0966-9795(02)00035-3 ◽

2002 ◽

Vol 10 (9) ◽

pp. 829-839 ◽

Cited By ~ 14

Author(s):

X.Y. Wang ◽

I.T.H. Chang ◽

M. Aindow

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Microstructural Development ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Deformation mechanisms in free-standing nanoscale thin films: A quantitative in situ transmission electron microscope study

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.0400066101 ◽

2004 ◽

Vol 101 (17) ◽

pp. 6335-6340 ◽

Cited By ~ 185

Author(s):

M. A. Haque ◽

M. T. A. Saif

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Deformation Mechanisms ◽

Free Standing ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films

Microscopy and Microanalysis ◽

10.1017/s1431927615010053 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 1855-1856

Author(s):

Tian T. Li ◽

Melissa K. Santala ◽

Leonardus Bimo Bayu Aji ◽

Sergei O. Kucheyev ◽

Huai-Yu M. Cheng ◽

...

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Amorphous Germanium ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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A scanning and transmission electron microscope study of the human minor salivary glands

Archives of Oral Biology ◽

10.1016/s0003-9969(99)00046-1 ◽

1999 ◽

Vol 44 ◽

pp. S27-S31 ◽

Cited By ~ 22

Author(s):

A Riva

Keyword(s):

Electron Microscope ◽

Salivary Glands ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Minor Salivary Glands ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Bismuth salts with versus without acid suppression for Helicobacter pylori infection: A transmission electron microscope study

Helicobacter ◽

10.1111/hel.12801 ◽

2021 ◽

Author(s):

Tsung‐Hsien Chiang ◽

Chieh‐Chang Chen ◽

Ping‐Huei Tseng ◽

Jyh‐Ming Liou ◽

Ming‐Shiang Wu ◽

...

Keyword(s):

Helicobacter Pylori ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Helicobacter Pylori Infection ◽

Acid Suppression ◽

Transmission Electron ◽

Bismuth Salts ◽

Transmission Electron Microscope Study

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Transmission electron microscope study of ion beam annealing effects of ion‐implanted and evaporated amorphous silicon

Journal of Applied Physics ◽

10.1063/1.329150 ◽

1981 ◽

Vol 52 (5) ◽

pp. 3304-3309 ◽

Cited By ~ 6

Author(s):

L. J. Chen ◽

Y. J. Wu ◽

Y. C. Yang ◽

K. P. Hsieh ◽

M. S. Lin ◽

...

Keyword(s):

Electron Microscope ◽

Amorphous Silicon ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Ion Beam ◽

Transmission Electron ◽

Annealing Effects ◽

Transmission Electron Microscope Study ◽

Ion Implanted

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