Sprayed zinc oxide films: Ultra-violet light-induced reversible surface wettability and platinum-sensitization-assisted improved liquefied petroleum gas response

In this research photodegradation of direct yellow dye using zinc oxide as catalyst under ultra-violet light has been investigated. The concentration of photocatalyst has been found to be 0.003 M, while the results reveal that, the best H2O2 concentration can be used as 10 ml, furthermore, pH to run the reaction of photodegradation was observed at acidic media. It has been found that the direct yellow dye can be oxidized by positive hole or hydroxyl radical or reduced by electron in the conduction band, the cleavage of N=N leads to break down the dye.

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Surface Wettability of Nanostructured Zinc Oxide Films

Journal of Electronic Materials ◽

10.1007/s11664-008-0615-0 ◽

2008 ◽

Vol 38 (4) ◽

pp. 601-608 ◽

Cited By ~ 27

Author(s):

Jie Han ◽

Wei Gao

Keyword(s):

Zinc Oxide ◽

Oxide Films ◽

Surface Wettability ◽

Zinc Oxide Films ◽

Nanostructured Zinc Oxide

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Effect of ultra-violet light irradiation on anodic oxide films on titanium in sulfuric acid solution

Journal of Electroanalytical Chemistry ◽

10.1016/s0022-0728(99)00238-7 ◽

1999 ◽

Vol 473 (1-2) ◽

pp. 272-278 ◽

Cited By ~ 12

Author(s):

Toshiaki Ohtsuka ◽

Tetsuo Otsuki

Keyword(s):

Sulfuric Acid ◽

Acid Solution ◽

Sulfuric Acid Solution ◽

Oxide Films ◽

Ultra Violet ◽

Anodic Oxide ◽

Light Irradiation ◽

Ultra Violet Light ◽

Anodic Oxide Films ◽

Violet Light

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Analysis of Sputtered Zinc Oxide Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600001781 ◽

1980 ◽

Vol 38 ◽

pp. 416-417

Author(s):

T. A. Emma ◽

M. P. Singh

Keyword(s):

Electron Microscopy ◽

Zinc Oxide ◽

Piezoelectric Materials ◽

Oxide Films ◽

Optical Quality ◽

Zno Films ◽

Rf Power ◽

X Ray Diffraction ◽

Sputtered Films ◽

Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

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