Lattice strain and damage evolution of 9–12%Cr ferritic/martensitic steel during in situ tensile test by X-ray diffraction and small angle scattering

2010 ◽  
Vol 407 (1) ◽  
pp. 10-15 ◽  
Author(s):  
Xiao Pan ◽  
Xianglin Wu ◽  
Kun Mo ◽  
Xiang Chen ◽  
Jonathan Almer ◽  
...  
Keyword(s):  
Tensile Test ◽  
Small Angle ◽  
Damage Evolution ◽  
Lattice Strain ◽  
Martensitic Steel ◽  
Small Angle Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Angle Scattering

An X-Ray Small-Angle Scattering Instrument

1967 ◽  
Vol 11 ◽  
pp. 332-338 ◽  
Author(s):  
Donald M. Koffman
Keyword(s):  
Small Angle ◽  
Scintillation Counter ◽  
Small Angle Scattering ◽  
High Angular Resolution ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Angle Scattering ◽  
Diffraction Patterns

AbstractAn X-ray small-angle scattering instrument is described which is used for recording X-ray diffraction patterns or small-angle X-ray scattering curves in an angular region very close to the direct beam. The measurement of X-ray intensity is accomplished with standard geiger or scintillation counter techniques. The instrument is designed for use with a spot-focus or vertical-line X-ray source, In essence, it is a multiple-reflection double-crystal diffractometer, based on a concept developed by Bonse and Hart, employing two grooved perfect germanium crystals arranged in the parallel position. Multiple diffraction from these crystals produces a monochromated X-ray beam which can be several millimeters wide while still exhibiting extremely high angular resolution. As a result, effective sample volumes can be employed with maximum volume-to-thickness ratios. The principal features of the instrument are discussed with emphasis on the advantages of this device over those employing complex slit systems and film-re cording techniques, Data are presented to illustrate the operation, intensity, and resolution of the unit.

In-situ X-Ray Small Angle Scattering during the Crystallization of Amorphous Mg76Zn24

1986 ◽  
Vol 41 (9) ◽  
pp. 1123-1128 ◽  
Author(s):  
M. Schaal ◽  
P. Lamparter ◽  
S. Steeb
Keyword(s):  
Phase Diagram ◽  
Amorphous Phase ◽  
Small Angle ◽  
Small Angle Scattering ◽  
Crystalline Phases ◽  
X Ray ◽  
Β Phase ◽  
Angle Scattering

By X-Ray small angle scattering the relaxation and crystallization of amorphous Mg76Zn24 was investigated in-situ. Radii of gyration of the different phases developing during the annealing of the sample were determined. By comparison of the small angle scattering results with DSC-results from the literature and the phase diagram the different phases could be identified. The crystallization of amorphous Mg76Zn24 is preceded by the formation of β-phase (Mg72Zn28)-like inhomogeneities in the amorphous phase. Further annealing leads to the final crystalline phases γ-MgZn and Mg.

Effect of finite spatial coherence length on small-angle scattering

2015 ◽  
Vol 48 (6) ◽  
pp. 1660-1664 ◽  
Author(s):  
Yuya Shinohara ◽  
Yoshiyuki Amemiya
Keyword(s):  
Small Angle ◽  
Coherence Length ◽  
Spatial Coherence ◽  
Small Angle Scattering ◽  
Forward Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Imaging ◽  
Angle Scattering ◽  
Diffraction Imaging

This study shows that forward scattering at the origin of reciprocal space contributes to the scattering intensity profiles of ultra-small-angle scattering. The forward scattering corresponds to a Fourier transform of the X-ray coherent volume on a sample. This contribution is usually ignored in the study of small-angle scattering, while it is fully considered in the fields of X-ray imaging, such as coherent X-ray diffraction imaging and X-ray ptychography. This effect is explicitly illustrated in the context of small-angle scattering, and the effect of a finite spatial coherence length on small-angle scattering is discussed.

X-ray transparent proton-exchange membrane fuel cell design for in situ wide and small angle scattering tomography

2019 ◽  
Vol 437 ◽  
pp. 226906 ◽  
Author(s):  
Isaac Martens ◽  
Antonis Vamvakeros ◽  
Raphael Chattot ◽  
Maria V. Blanco ◽  
Miika Rasola ◽  
...  
Keyword(s):  
Fuel Cell ◽  
Small Angle ◽  
Proton Exchange Membrane ◽  
Small Angle Scattering ◽  
Proton Exchange ◽  
Cell Design ◽  
X Ray ◽  
Angle Scattering ◽  
Exchange Membrane

scholarly journals Lattice Strain Evolutions in Ni-W Alloys during a Tensile Test Combined with Synchrotron X-ray Diffraction

Materials ◽  
2020 ◽  
Vol 13 (18) ◽  
pp. 4027
Author(s):  
Tarik Sadat ◽  
Damien Faurie ◽  
Dominique Thiaudière ◽  
Cristian Mocuta ◽  
David Tingaud ◽  
...  
Keyword(s):  
Solid Solution ◽  
Tensile Test ◽  
Single Phase ◽  
Lattice Strain ◽  
Tensile Tests ◽  
X Ray Diffraction ◽  
X Ray ◽  
Significant Difference ◽  
Diffraction Peaks

Ni and Ni(W) solid solution of bulk Ni and Ni-W alloys (Ni-10W, Ni-30W, and Ni-50W) (wt%) were mechanically compared through the evolution of their {111} X-ray diffraction peaks during in situ tensile tests on the DiffAbs beamline at the Synchrotron SOLEIL. A significant difference in terms of strain heterogeneities and lattice strain evolution occurred as the plastic activity increased. Such differences are attributed to the number of brittle W clusters and the hardening due to the solid solution compared to the single-phase bulk Ni sample.

scholarly journals Small-angle scattering for beginners

2021 ◽  
Vol 54 (6) ◽  
Author(s):  
Cedric J. Gommes ◽  
Sebastian Jaksch ◽  
Henrich Frielinghaus
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
X Rays ◽  
X Ray Diffraction ◽  
Experimental Conditions ◽  
Time Resolved ◽  
Characterization Methods ◽  
Angle Scattering

Many experimental methods are available for the characterization of nanostructures, but most of them are limited by stringent experimental conditions. When it comes to analysing nanostructures in the bulk or in their natural environment – even as ordinary as water at room temperature – small-angle scattering (SAS) of X-rays or neutrons is often the only option. The rapid worldwide development of synchrotron and neutron facilities over recent decades has opened unprecedented possibilities for using SAS in situ and in a time-resolved way. But, in spite of its huge potential in the field of nanomaterials in general, SAS is covered far less than other characterization methods in non-specialized curricula. Presented here is a rigorous discussion of small-angle scattering, at a technical level comparable to the classical undergraduate coverage of X-ray diffraction by crystals and which contains diffraction as a particular case.

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