Physical properties of ZnSe thin films deposited on glass and silicon substrates

2014 ◽  
Vol 75 (6) ◽  
pp. 713-725 ◽  
Author(s):  
A.P. Pardo Gonzalez ◽  
H.G. Castro-Lora ◽  
L.D. López-Carreño ◽  
H.M. Martínez ◽  
N.J. Torres Salcedo
Keyword(s):  
Thin Films ◽  
Physical Properties ◽  
Silicon Substrates ◽  
Znse Thin Films

scholarly journals Physical properties of lanthanum monosulfide thin films grown on (100) silicon substrates

2006 ◽  
Vol 99 (12) ◽  
pp. 123502 ◽  
Author(s):  
M. Cahay ◽  
K. Garre ◽  
X. Wu ◽  
D. Poitras ◽  
D. J. Lockwood ◽  
...  
Keyword(s):  
Thin Films ◽  
Physical Properties ◽  
Silicon Substrates ◽  
Lanthanum Monosulfide

Thermal annealing induced physical properties of ZnSe thin films for buffer layer in solar cells

2020 ◽  
Vol 117 ◽  
pp. 113845 ◽  
Author(s):  
S. Chuhadiya ◽  
R. Sharma ◽  
Himanshu ◽  
S.L. Patel ◽  
S. Chander ◽  
...  
Keyword(s):  
Thin Films ◽  
Solar Cells ◽  
Physical Properties ◽  
Buffer Layer ◽  
Thermal Annealing ◽  
Znse Thin Films

Physical Properties of ZnSe Thin Films Depending on the Process Parameters

2013 ◽  
Vol 586 (1) ◽  
pp. 129-137 ◽  
Author(s):  
Maeng Jun Kim ◽  
Sung Ho Lee ◽  
Hong Tak Kim ◽  
Sang Ho Sohn
Keyword(s):  
Thin Films ◽  
Physical Properties ◽  
Process Parameters ◽  
Znse Thin Films

Impact of different annealing conditions on physical properties of ZnSe thin films for ecofriendly buffer layer applications

2020 ◽  
Vol 132 ◽  
pp. 110982 ◽  
Author(s):  
Deepak Suthar ◽  
G. Chasta ◽  
Himanshu ◽  
S.L. Patel ◽  
S. Chander ◽  
...  
Keyword(s):  
Thin Films ◽  
Physical Properties ◽  
Buffer Layer ◽  
Annealing Conditions ◽  
Znse Thin Films

Physical properties of rf-sputtered ZnS and ZnSe thin films used for double-heterojunction ZnS/ZnSe/CdTe photovoltaic structures

2019 ◽  
Vol 478 ◽  
pp. 831-839 ◽  
Author(s):  
O. Toma ◽  
L. Ion ◽  
S. Iftimie ◽  
V.A. Antohe ◽  
A. Radu ◽  
...  
Keyword(s):  
Thin Films ◽  
Physical Properties ◽  
Double Heterojunction ◽  
Znse Thin Films

Physical properties of ZnSe thin films: Air and vacuum annealing evolution to buffer layer applications

2020 ◽  
Vol 384 (4) ◽  
pp. 126097 ◽  
Author(s):  
Ritika Sharma ◽  
Himanshu ◽  
S.L. Patel ◽  
S. Chander ◽  
M.D. Kannan ◽  
...  
Keyword(s):  
Thin Films ◽  
Physical Properties ◽  
Buffer Layer ◽  
Vacuum Annealing ◽  
Znse Thin Films

Finite-Element Modeling and Quantitative Measurement Using Scanning Microwave Microscopy to Characterize Dielectric Films

2018 ◽  
Author(s):  
K. A. Rubin ◽  
W. Jolley ◽  
Y. Yang
Keyword(s):  
Thin Films ◽  
Dielectric Film ◽  
Dielectric Constants ◽  
Dielectric Films ◽  
Silicon Substrates ◽  
Fem Modeling ◽  
Dielectric Thin Films ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Low K

Abstract Scanning Microwave Impedance Microscopy (sMIM) can be used to characterize dielectric thin films and to quantitatively discern film thickness differences. FEM modeling of the sMIM response provides understanding of how to connect the measured sMIM signals to the underlying properties of the dielectric film and its substrate. Modeling shows that sMIM can be used to characterize a range of dielectric film thicknesses spanning both low-k and medium-k dielectric constants. A model system consisting of SiO2 thin films of various thickness on silicon substrates is used to illustrate the technique experimentally.

Effects of Tin Doping on the Physical Properties of Thermally Deposited Sb2S3 Thin Films

2013 ◽  
Vol 9 (4) ◽  
pp. 532-535
Author(s):  
N. Ali ◽  
W. A. A. Syed ◽  
I. Murtaza ◽  
S. T. Hussain ◽  
N. Ahmad ◽  
...  
Keyword(s):  
Thin Films ◽  
Physical Properties
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