High-quality virus images obtained by transmission electron microscopy and charge coupled device digital camera technology

2009 ◽  
Vol 159 (1) ◽  
pp. 87-92 ◽  
Author(s):  
Kenneth L. Tiekotter ◽  
Hans-W. Ackermann
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Digital Camera ◽  
High Quality ◽  
Charge Coupled Device ◽  
Transmission Electron

scholarly journals Digital Imaging: When Should One Take The Plunge?

1997 ◽  
Vol 5 (4) ◽  
pp. 14-15
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
High Quality ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quality positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).

scholarly journals High quality ultrafast transmission electron microscopy using resonant microwave cavities

2018 ◽  
Vol 188 ◽  
pp. 85-89 ◽  
Author(s):  
W. Verhoeven ◽  
J.F.M. van Rens ◽  
E.R. Kieft ◽  
P.H.A. Mutsaers ◽  
O.J. Luiten
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Quality ◽  
Microwave Cavities ◽  
Transmission Electron

Characterization and Growth Mechanism of B12As2 Epitaxial Layers Grown on (1-100) 15R-SiC

2008 ◽  
Vol 1069 ◽  
Author(s):  
Hui Chen ◽  
Guan Wang ◽  
Michael Dudley ◽  
Zhou Xu ◽  
James. H. Edgar ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Growth Mechanism ◽  
Heteroepitaxial Growth ◽  
High Quality ◽  
X Ray ◽  
Transmission Electron ◽  
Substrate Choice

ABSTRACTA systematic study is presented of the heteroepitaxial growth of B12As2 on m-plane 15R-SiC. In contrast to previous studies of B12As2 on other substrates, including (100) Si, (110) Si, (111) Si and (0001) 6H-SiC, single crystalline and untwinned B12As2 was achieved on m-plane 15R-SiC. Observations of IBA on m-plane (1100)15R-SiC by synchrotron white beam x-ray topography (SWBXT) and high resolution transmission electron microscopy (HRTEM) confirm the good quality of the films on the 15R-SiC substrates. The growth mechanism of IBA on m-plane 15R-SiC is discussed. This work demonstrates that m-plane 15R-SiC is potentially a good substrate choice to grow high quality B12As2 epilayers.

The Flocculation and Stability of TiO2 Nanoparticles

2012 ◽  
Vol 548 ◽  
pp. 138-142
Author(s):  
Xiao Ying Liu ◽  
Xiao Dong Hao ◽  
Chun Xiang Gu ◽  
Yu Xin Zhang ◽  
Xin Lu Li ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Digital Camera ◽  
Processing Conditions ◽  
X Ray Diffraction ◽  
Thermogravimetric Method ◽  
X Ray ◽  
Transmission Electron ◽  
Potential Applications ◽  
Solvent Washing

In this work, TiO2nanoparticles (NPs) were prepared through a well-developed hydrothermal method. The dry products were characterized by digital camera, transmission electron microscopy (TEM), X-ray diffraction (XRD) and thermogravimetric method (TGA). These results suggested that TiO2NPs were well-crystallized and oleic acid-capped (OA-capped; 33.42 wt.%). In order to investigate the flocculation and stability of TiO2NPs colloids, redispersed experiments were carried out by altering the preparative parameters (e.g., redispersion solvent, washing times). In addition, the compounding stability of TiO2NPs colloids with AuNPs colloids and MnO4-solution under processing conditions (e.g., aging with stirring and under UV irradiation) were also studied. In principle, systematic investigations of flocculation and stability of TiO2NPs will be useful for their potential applications including novel photocatalysts and biosensors.

Microstructure and growth of joins in melt-textured YBa2Cu3O7−δ

2001 ◽  
Vol 16 (8) ◽  
pp. 2298-2305 ◽  
Author(s):  
A. D. Bradley ◽  
W. Lo ◽  
M. Mironova ◽  
N. H. Babu ◽  
D. A. Cardwell ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Liquid Phase ◽  
Grain Boundary ◽  
Electron Probe ◽  
High Quality ◽  
Strongly Coupled ◽  
External Agent ◽  
Transmission Electron

Joining of melt-textured YBa2Cu3O7-δ (Y123) grains has been achieved without use of an external agent. The technique uses barium-cuprate liquid phase released from platelet boundaries to mediate the growth of Y123 at the interface between two grains. The epitaxial nature and high quality of the growth was determined by optical and transmission electron microscopy. The composition of Ba–Cu–O phases found in some parts of the joins was determined by electron probe microanalysis. A clean low-angle join was found to consist of a grain boundary with dislocation networks and facets. Transport critical current measurements on this type of join revealed strongly coupled behavior. The technique shows promise for the joining of melt-textured material for power engineering applications.

Semi-Coherent Yttria Inclusions Occurring Spontaneously in YBa2Cu3O6+× Films Grown by Dc Magnetron Sputtering

1992 ◽  
Vol 275 ◽  
Author(s):  
T. I. Selinder ◽  
Z. Han ◽  
U. Helmersson ◽  
J. Magnusson ◽  
P. Norling ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetron Sputtering ◽  
Critical Current ◽  
Film Growth ◽  
Number Density ◽  
Dc Magnetron Sputtering ◽  
High Quality ◽  
Transmission Electron ◽  
Current Densities

ABSTRACTSemi-coherent Y2O3 (yttria) inclusions have been observed in high quality, c-axis oriented YBa2Cu3O6+×,(YBCO) Alms. The inclusions were studied by transmission electron microscopy (TEM), and were found to be embedded in the YBCO matrix without disturbing its structure seriously. Their number density is estimated to higher than 2 × 1016 cm−3 in epitaxial YBCO films, having transport critical current densities in excess of 1 × 106 A cm−2 at 77 K. Magnetization measurements indicate a possible correlation between a high density of yttria inclusions and high pinning strength. The effects of the inclusions on film growth and microstructure is discussed.

scholarly journals Microwave Processing in Diagnostic Electron Microscopy

2003 ◽  
Vol 11 (6) ◽  
pp. 38-41 ◽  
Author(s):  
Ross G. Gerrity ◽  
George W. Forbes
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quality Control ◽  
Time Factors ◽  
Time Constraints ◽  
Small Samples ◽  
Tissue Quality ◽  
High Quality ◽  
Factors Associated ◽  
Transmission Electron

Transmission electron microscopy (TEM) continues to play an important role in diagnostic surgical pathology, particularly in such areas as kidney pathology and tumor diagnosis, among others. Diagnostic TEM is subject to unique time constraints, quality control regulations, and other problems not seen in other TEM applications. The diagnostic TEM laboratory must produce high-quality electron microscopy on small samples which frequently are suboptirnal in fixation and tissue quality due to the pathology involved and time factors associated with biopsy and surgery.

Semiconductor nanowires from oxides

1999 ◽  
Vol 14 (12) ◽  
pp. 4503-4507 ◽  
Author(s):  
S. T. Lee ◽  
Y. F. Zhang ◽  
N. Wang ◽  
Y. H. Tang ◽  
I. Bello ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Thermal Evaporation ◽  
Microscopy Study ◽  
Semiconductor Nanowires ◽  
Electron Microscopy Study ◽  
Defect Structures ◽  
Transmission Electron Microscopy Study ◽  
High Quality ◽  
Transmission Electron

Highly pure, ultralong, and uniform-sized semiconductor nanowires in bulk quantity were synthesized by thermal evaporation or laser ablation of semiconductor powders mixed with oxides. Transmission electron microscopy study shows that decomposition of semiconductor suboxides and defect structures play important roles in enhancing the formation and growth of high-quality nanowires. A new growth mechanism is proposed on the basis of microstructure and different morphologies of the nanowires observed.

Quantitative in situ hot-stage high-resolution Transmission Electron Microscopy

1994 ◽  
Vol 52 ◽  
pp. 758-759
Author(s):  
J. M. Howe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Interfacial Structure ◽  
Interface Motion ◽  
Charge Coupled Device ◽  
Transmission Electron ◽  
Interface Theory ◽  
A Charge

In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information complements detailed static observations and calculations of interfacial structure, and is essential for understanding interface theory and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion during precipitation of {111} θ phase in an Al-Cu-Mg-Ag alloy.The specimen and microscope requirements for in situ hot-stage HRTEM are not much different from those of static HRTEM, except that one must have a heating holder and equipment for recording and analyzing dynamic images. At present, most HRTEMs are equipped with a TV-rate camera, possibly combined with a charge-coupled device camera. An inexpensive way to record in situ HRTEM images is to send the output from the TV-rate camera directly into a standard VHS format videocassette recorder (VCR).

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