A pseudo-3D approach based on electron backscatter diffraction and backscatter electron imaging to study the character of phase boundaries between Mg and long period stacking ordered phase in a Mg–2Y–Zn alloy

2015 ◽  
Vol 101 ◽  
pp. 130-135 ◽  
Author(s):  
Mehran Afshar ◽  
Stefan Zaefferer
Keyword(s):  
Electron Backscatter Diffraction ◽  
Backscatter Electron ◽  
Phase Boundaries ◽  
Long Period ◽  
Electron Backscatter ◽  
Backscatter Electron Imaging ◽  
Electron Imaging ◽  
Backscatter Diffraction ◽  
Zn Alloy

Orientation Correlation during α→β Up-Transformation Induced by Electric Current Pulses in a Cu-Zn Alloy

2014 ◽  
Vol 783-786 ◽  
pp. 2406-2409
Author(s):  
Xiang Zhao ◽  
Xin Li Wang ◽  
Dong Xue Li ◽  
Wen Bin Dai
Keyword(s):  
Electric Current ◽  
Orientation Relationship ◽  
Electron Backscatter Diffraction ◽  
Current Pulses ◽  
Α Phase ◽  
Electric Current Pulses ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
The Relationship ◽  
Zn Alloy

In this work, the orientation of the β variants within a single parent α grain on the α→β up-transformation induced by electric current pulses in a Cu-Zn alloy was investigated. Electron backscatter diffraction (EBSD) was used to determine the relationship between the α phase and the β variants. By EBSD analysis, it was found that crystallographic variant selection was observed not only across those prior α/α grain boundaries, but also within the α grain interior. Results revealed that the orientation relationship between the α phase and the β associated with nucleation from α phase was close to the Kurdjumov-Sachs (K-S) orientation relationship, which better described the orientation relationship for α nucleation within β grains.

The Backscatter Electron Signal as an Additional Tool for Phase Segmentation in Electron Backscatter Diffraction

2013 ◽  
Vol 19 (4) ◽  
pp. 929-941 ◽  
Author(s):  
E.J. Payton ◽  
G. Nolze
Keyword(s):  
Electron Backscatter Diffraction ◽  
Backscatter Electron ◽  
Local Composition ◽  
Additional Tool ◽  
Simultaneous Acquisition ◽  
Steel Oxidation ◽  
Electron Backscatter ◽  
Oxidation Layers ◽  
Backscatter Diffraction ◽  
Time Limitations

AbstractThe advent of simultaneous energy dispersive X-ray spectroscopy (EDS) data collection has vastly improved the phase separation capabilities for electron backscatter diffraction (EBSD) mapping. A major problem remains, however, in distinguishing between multiple cubic phases in a specimen, especially when the compositions of the phases are similar or their particle sizes are small, because the EDS interaction volume is much larger than that of EBSD and the EDS spectra collected during spatial mapping are generally noisy due to time limitations and the need to minimize sample drift. The backscatter electron (BSE) signal is very sensitive to the local composition due to its atomic number (Z) dependence. BSE imaging is investigated as a complimentary tool to EDS to assist phase segmentation and identification in EBSD through examination of specimens of meteorite, Cu dross, and steel oxidation layers. The results demonstrate that the simultaneous acquisition of EBSD patterns, EDS spectra, and the BSE signal can provide new potential for advancing multiphase material characterization in the scanning electron microscope.

scholarly journals Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

2015 ◽  
Vol 92 (20) ◽  
Author(s):  
S. Vespucci ◽  
A. Winkelmann ◽  
G. Naresh-Kumar ◽  
K. P. Mingard ◽  
D. Maneuski ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Electron Backscatter ◽  
Diffraction Patterns ◽  
Electron Imaging ◽  
Backscatter Diffraction

scholarly journals Spatial Resolution of Electron Backscatter Diffraction in a FEG-SEM

1996 ◽  
Vol 54 ◽  
pp. 348-349
Author(s):  
Edward A. Kenik
Keyword(s):  
Spatial Resolution ◽  
Electron Backscatter Diffraction ◽  
Backscatter Electron ◽  
Interaction Volume ◽  
Backscattered Electrons ◽  
Area Detector ◽  
Probe Size ◽  
Electron Backscatter ◽  
Similar Information ◽  
Backscatter Diffraction

Crystallographic information can be determined for bulk specimens in a SEM by utilizing electron backscatter diffraction (EBSD), which is also referred to as backscatter electron Kikuchi diffraction. This technique provides similar information to that provided by selected area electron channeling (SAEC). However, the spatial resolutions of the two techniques are limited by different processes. In SAEC patterns, the spatial resolution is limited to ˜2 μm by the motion of the beam on the specimen, which results from the angular rocking of the beam and the aberration of the probe forming lens. Therefore, smaller incident probe sizes provide no improvement in spatial resolution of SAEC patterns. In contrast, the spatial resolution for EBSD, which uses a stationary beam and an area detector, is determined by 1) the incident probe size and 2) the size of the interaction volume from which significant backscattered electrons are produced in the direction of the EBSD detector. The second factor is influenced by the accelerating voltage, the specimen tilt, and the relative orientation of scattering direction and the specimen tilt axis.

Analysis of Chemical Changes and Microstructure Characterization during Deformation in Ferritic Stainless Steel

2013 ◽  
Vol 19 (4) ◽  
pp. 959-968 ◽  
Author(s):  
Andrés Núñez ◽  
Xavier Llovet ◽  
Juan F. Almagro
Keyword(s):  
Stainless Steel ◽  
Ferritic Stainless Steel ◽  
Electron Backscatter Diffraction ◽  
Biaxial Tension ◽  
Annealing Treatment ◽  
Chemical Compositions ◽  
Backscatter Electron Imaging ◽  
Electron Imaging ◽  
Deformation Tests ◽  
Backscatter Diffraction

AbstractUni- and biaxial tension deformation tests, with different degrees of deformation, have been done on AISI 430 (EN 1.4016) ferritic stainless steel samples, which had both different chemical compositions and had undergone different annealing treatments. The initial and deformed materials were characterized by using electron backscatter diffraction and backscatter electron imaging in a scanning electron microscope together with electron probe microanalysis. The correlation observed among the chemical compositions, annealing treatment, and strain level obtained after deformation is discussed.

The Interface Character Distribution and Intergrannular Corrosion Resistance of Duplex Stainless Steel UNS S32304

2016 ◽  
Vol 879 ◽  
pp. 536-541
Author(s):  
Jian Sheng Zhang ◽  
Yan Li Zhu ◽  
Xiao Ying Fang ◽  
Wen Hong Yin ◽  
Cong Xiang Qin
Keyword(s):  
Solid Solution ◽  
Stainless Steel ◽  
Corrosion Resistance ◽  
Stainless Steels ◽  
Electron Backscatter Diffraction ◽  
Solution Annealing ◽  
Phase Boundaries ◽  
Electron Backscatter ◽  
Character Distribution ◽  
Backscatter Diffraction

The duplex stainless steels (UNS S32304) after solid solution annealing at two different temperature (1323K and 1573K) were subjected to the same cold rolling with ε =3 and subsequent annealing for 230 min at 1323 K . The corresponding interface character distribution (ICD) were determined by electron backscatter diffraction (EBSD). The results show that a larger population of phase boundaries (PB) having K-S orientation relationship (OR) between the neighboring δ and γ grains was introduced and therefore higher intergrannular corrosion resistance (ICR) were resulted in the specimen initially solid-solution annealed at 1573K.

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