Study of breakdown in ultrathin gate dielectrics using constant voltage stress and successive constant voltage stress
2005 ◽
Vol 80
◽
pp. 170-173
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2003 ◽
Vol 47
(1)
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pp. 71-76
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Keyword(s):
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2010 ◽
Vol 54
(9)
◽
pp. 979-984
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2016 ◽
Vol 63
(6)
◽
pp. 2268-2274
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