scholarly journals Point Defect Study in Fe75Al25 and Fe70Al25X5 X=(Cr, Ni) Alloys as a Function of Thermal Treatment by Positron Lifetime Spectroscopy

2012 ◽  
Vol 35 ◽  
pp. 86-91 ◽  
Author(s):  
J. Kansy ◽  
A. Hanc ◽  
D. Giebel
1998 ◽  
Vol 552 ◽  
Author(s):  
Werner Puff ◽  
Bernd Logar ◽  
Adam G. Balogh

ABSTRACTVacancy-like defects in CoAl in the composition range 48.5 at.-% <Cco, < 53 at.-% are investigated by means of positron lifetime spectroscopy and Doppler-broadening measurements. The observed lifetimes in the annealed samples confirm that defects are quenched-in during the production of the samples. The values of the positron lifetime and the S-parameter decrease with increasing Co concentration. After quenching from 1400°C or 1600°C an increase in the positron parameters isobserved. Long-time annealing of the Co-rich sample shows a dramatic decrease of the positron lifetime to the expected bulk lifetime.


2015 ◽  
Vol 213 (1) ◽  
pp. 165-169 ◽  
Author(s):  
Christian Herold ◽  
Hubert Ceeh ◽  
Thomas Gigl ◽  
Markus Reiner ◽  
Marco Haumann ◽  
...  

1995 ◽  
Vol 60 (6) ◽  
pp. 541-544 ◽  
Author(s):  
A. Polity ◽  
Th. Abgarjan ◽  
R. Krause-Rehberg

2008 ◽  
Vol 607 ◽  
pp. 134-136
Author(s):  
Y.J. Zhang ◽  
Ai Hong Deng ◽  
You Wen Zhao ◽  
J. Yu ◽  
X.X. Yu ◽  
...  

Positron annihilation lifetime (PAL) spectroscopy,photo-induced current transient spectroscopy (PICTS) and thermally stimulated current (TSC) have been employed to study the formation of compensation defects and their evolvement under iron phosphide (IP) ambience or pure phosphide (PP) ambience. In the formation of IP SI-InP, the diffusion of Fe atoms suppresses the formation of some open-volume defects. As to PP SI-InP, VInH4 complexes dissociate into acceptor vacancies VInHn(n-3)(n=0,1,2,3), which compensate residual donor type defects and make the sample semi-insulating. Electron irradiation-induced deep level defects have been studied by TSC in PP and IP SI-InP, respectively. In contrast to a high concentration of irradiation-induced defects in as-grown and PP annealed InP, IP SI-InP has a very low concentration of defects.


1988 ◽  
Vol 38 (14) ◽  
pp. 9545-9554 ◽  
Author(s):  
H.-E. Schaefer ◽  
R. Würschum ◽  
R. Birringer ◽  
H. Gleiter

2013 ◽  
Vol 51 (15) ◽  
pp. 1157-1161 ◽  
Author(s):  
Jason Engbrecht ◽  
David Green ◽  
Marc A. Hillmyer ◽  
David Olson ◽  
Eric M. Todd

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