Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells

2016 ◽  
Vol 63 (4) ◽  
pp. 2250-2256 ◽  
Author(s):  
Maxim S. Gorbunov ◽  
Anna B. Boruzdina ◽  
Pavel S. Dolotov
Keyword(s):  
Cross Section ◽  
Empirical Method ◽  
Single Event Upset ◽  
Single Event ◽  
Semi Empirical

Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs

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Vol 23 (3) ◽  
pp. 811-816
Author(s):  
姚志斌 Yao Zhibin ◽  
范如玉 Fan Ruyu ◽  
郭红霞 Guo Hongxia ◽  
王忠明 Wang Zhongming ◽  
何宝平 He Baoping ◽  
...  
Keyword(s):  
Cross Section ◽  
Single Event Upset ◽  
Single Event

Modeling the heavy ion cross-section for single event upset with track structure effects: the HIC-UP-TS model

1996 ◽  
Vol 43 (6) ◽  
pp. 2814-2819 ◽  
Author(s):  
L.W. Connell ◽  
F.W. Sexton ◽  
P.J. McDaniel ◽  
A.K. Prinja
Keyword(s):  
Cross Section ◽  
Heavy Ion ◽  
Track Structure ◽  
Single Event Upset ◽  
Single Event

scholarly journals Impact of recombination on heavy ion induced single event upset cross-section

2016 ◽  
Vol 151 ◽  
pp. 012040
Author(s):  
K S Zemtsov ◽  
A M Galimov ◽  
M E Gorchichko ◽  
I V Elushov
Keyword(s):  
Cross Section ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event

Modification of single event upset cross section of an SRAM at high frequencies

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Vol 43 (3) ◽  
pp. 924-930 ◽  
Author(s):  
S. Buchner ◽  
A.B. Campbell ◽  
D. McMorrow ◽  
J. Melinger ◽  
M. Masti ◽  
...  
Keyword(s):  
Cross Section ◽  
Single Event Upset ◽  
Single Event ◽  
High Frequencies
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