Surface zone-axis patterns
In electron diffraction from crystals, whether it be in reflection or transmission, the intensity of the emergent beams varies in a complex way with the angle that the incident beam makes with the crystal structure. The techniques for displaying this variation of intensity as a function of incident beam orientation have mostly been applied to zone-axis orientations, where the variation is particularly elaborate. The resulting patterns, known as zone-axis patterns or zaps, have become an important part of transmission electron microscopy.There are several techniques for obtaining zaps. The best known is convergent-beam diffraction but they can also be obtained in the form of bend-contour patterns and Tanaka patterns, and by rocking methods.