Surface Characterization of Gallium Nitride Modified with Peptides before and after Exposure to Ionizing Radiation in Solution

Langmuir ◽  
2014 ◽  
Vol 30 (51) ◽  
pp. 15477-15485 ◽  
Author(s):  
Nora G. Berg ◽  
Michael W. Nolan ◽  
Tania Paskova ◽  
Albena Ivanisevic
Keyword(s):  
Gallium Nitride ◽  
Ionizing Radiation ◽  
Surface Characterization ◽  
Before And After

Surface Characterization of Monolithic Zirconia Following Treatment with Different Polishing Techniques

2020 ◽  
Vol 980 ◽  
pp. 176-186
Author(s):  
Zhen Yu Tang ◽  
Xin Yi Zhao ◽  
Anderson T. Hara
Keyword(s):  
Phase Transformation ◽  
Surface Characterization ◽  
Point Of View ◽  
Xps Analysis ◽  
Diamond Bur ◽  
Before And After ◽  
Monolithic Zirconia ◽  
Polishing Procedures ◽  
Xrd Patterns

The purpose of this study was to evaluate the effects of different polishing techniques on the topographical features and phase transformation of monolithic zirconia. Four brands of zirconia were ground and polished using one of four systems. All zirconia specimens were ground with a fine-grit diamond bur (GB) prior to polishing procedures. The surface roughness and phase transition (XRD) were evaluated, and surface characterizations (SEM and XPS) were performed. The highest roughness was obtained with the Tob system. The strongest diffraction peak in the obtained XRD patterns was at 2θ=30.246°. No monoclinic phase change was found in any group. The XPS analysis showed that the atomic percentages of yttrium in the specimens of Cercon before and after polishing were the highest of any sample. All the polishing systems tested may not adversely affect the phase transformation of monolithic zirconia. The Tob system resulted in the highest roughness. The XPS analysis showed that grinding and polishing had some effects on the properties of zirconia from a microscopic point of view.

Surface characterization of titanium implant healing abutments before and after placement

2017 ◽  
Vol 20 (2) ◽  
pp. 180-190 ◽  
Author(s):  
Sutton E. Wheelis ◽  
Thomas G. Wilson ◽  
Pilar Valderrama ◽  
Danieli C. Rodrigues
Keyword(s):  
Surface Characterization ◽  
Titanium Implant ◽  
Before And After

Surface Characterization of the Spinel LixMn2O4Cathode before and after Storage at Elevated Temperatures

2001 ◽  
Vol 13 (11) ◽  
pp. 4207-4212 ◽  
Author(s):  
Forest T. Quinlan ◽  
Keiichiro Sano ◽  
Trevor Willey ◽  
Ruxandra Vidu ◽  
Ken Tasaki ◽  
...  
Keyword(s):  
Surface Characterization ◽  
Elevated Temperatures ◽  
Before And After

scholarly journals Surface Characterization of Absorbing Polymer Films Deposited on Transparent Glasses

e-Polymers ◽  
2008 ◽  
Vol 8 (1) ◽  
Author(s):  
Débora Gonçalves ◽  
Silmar A. Travain ◽  
José A. Giacometti ◽  
Eugene A. Irene
Keyword(s):  
Polymer Films ◽  
Surface Characterization ◽  
Transparent Glass ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Before And After

AbstractPANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS spectroscopy and atomic force microscopy. A method is developed to accurately analyze ellipsometric data obtained for transparent glass substrates before and after modification with absorbing polymer films. Surface modification was made with an overlayer such as polyaniline (PANI), which exhibits different optical properties by varying its oxidation state. First, the issue of using transparent substrates for ellipsometry studies was examined and then, spectroscopic ellipsometry was used to characterize absorbing overlayers on transparent glasses. The same methodologies of data analysis can be also applied to other absorbing films on transparent substrates, and deposited by different techniques

Characterization of Widely Used Bipolar Transistors in Wide Temperature Range Before and After Ionizing Radiation Impact

2018 ◽  
Author(s):  
Alexander S. Bakerenkov ◽  
Aleksandr E. Koziukov ◽  
Alexander S. Rodin ◽  
Vladislav A. Felitsyn ◽  
Viacheslav S. Pershenkov ◽  
...  
Keyword(s):  
Ionizing Radiation ◽  
Wide Temperature Range ◽  
Bipolar Transistors ◽  
Temperature Range ◽  
Before And After

scholarly journals SURFACE CHARACTERIZATION OF TITANIUM ALLOYS FOR NITROGEN ION IMPLANTATION

2017 ◽  
Vol 9 ◽  
pp. 39
Author(s):  
Petr Vertat ◽  
Jan Drahokoupil ◽  
Petr Vlcak
Keyword(s):  
Surface Modification ◽  
Ion Implantation ◽  
Surface Characterization ◽  
X Ray Diffraction ◽  
Nitrogen Ion Implantation ◽  
X Ray ◽  
Commercially Pure ◽  
Before And After ◽  
Nitrogen Ion

Ion implantation is one of the modern methods of the surface modification of various materials. Industrially used Ti–6Al–4V titanium alloy and commercially pure Ti grade 2 were characterized using the X–ray diffraction methods. Texture of the material and dependence of the microstructural properties on the method of the surface modification were examined in order to determine suitable conditions for application of the process in the industry. The structure of Ti–6Al–4V alloy before and after the nitrogen ion implantation process is discussed and observed surface hardening is explained.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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