Imaging of biogenic and anthropogenic ocean surface films by the multifrequency/multipolarization SIR-C/X-SAR

Martin Gade

doi:10.1029/98jc01915

In-situ Measurements Of Ocean Surface Films Using A Small Buoy

10.1109/igarss.1990.688961 ◽

2005 ◽

Author(s):

V. Verma ◽

C. Teague ◽

D. Napolitano ◽

J. Vesecky

Keyword(s):

Ocean Surface ◽

In Situ Measurements ◽

Surface Films

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Imaging of biogenic and anthropogenic ocean surface films by the multifrequency/multipolarization SIR-C/X-SAR

Journal of Geophysical Research Atmospheres ◽

10.1029/97jc01915 ◽

1998 ◽

Vol 103 (C9) ◽

pp. 18851-18866 ◽

Cited By ~ 113

Author(s):

Martin Gade ◽

Werner Alpers ◽

Heinrich Hühnerfuss ◽

Harunobu Masuko ◽

Tatsuharu Kobayashi

Keyword(s):

Ocean Surface ◽

Surface Films

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Ocean surface films measured by interferential microwave probe

Il Nuovo Cimento C ◽

10.1007/bf02511363 ◽

1995 ◽

Vol 18 (4) ◽

pp. 375-383 ◽

Cited By ~ 4

Author(s):

B. Fiscella ◽

F. Gomez ◽

P. Pavese ◽

P. Trivero

Keyword(s):

Ocean Surface ◽

Surface Films ◽

Microwave Probe

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Surface Films on Zircaloy-2 Samples Cracked in Neutral Aqueous NaCl by Stress Corrosion

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070679 ◽

1973 ◽

Vol 31 ◽

pp. 46-47

Author(s):

R.A. Ploc

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Film Thickness ◽

Stress Corrosion ◽

Zirconium Dioxide ◽

Surface Film ◽

Surface Films ◽

Continuous Layer ◽

Transmission Electron ◽

Product Film

Samples of low-nickel Zircaloy-2 (material MLI-788-see(1)), when anodically polarized in neutral 5 wt% NaCl solutions, were found to be susceptible to pitting and stress corrosion cracking. The SEM revealed that pitting of stressed samples was occurring below a 2000Å thick surface film which behaved differently from normal zirconium dioxide in that it did not display interference colours. Since the initial film thickness was approximately 65Å, attempts were made to examine the product film by transmission electron microscopy to deduce composition and how the corrosion environment could penetrate the continuous layer.

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TEM studies of amorphization processes and amorphous structures

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100104303 ◽

1988 ◽

Vol 46 ◽

pp. 448-449

Author(s):

T. E. Mitchell ◽

R. B. Schwarz

Keyword(s):

Amorphous Materials ◽

Fission Products ◽

Rapid Quenching ◽

Surface Films ◽

List Type ◽

Oxide Glasses ◽

Crystalline Materials ◽

Amorphous Structures ◽

Amorphous Surface ◽

Interfacial Films

Traditional oxide glasses occur naturally as obsidian and can be made easily by suitable cooling histories. In the past 30 years, a variety of techniques have been discovered which amorphize normally crystalline materials such as metals. These include [1-3]:Rapid quenching from the vapor phase.Rapid quenching from the liquid phase.Electrodeposition of certain alloys, e.g. Fe-P.Oxidation of crystals to produce amorphous surface oxide layers.Interdiffusion of two pure crystalline metals.Hydrogen-induced vitrification of an intermetal1ic.Mechanical alloying and ball-milling of intermetal lie compounds.Irradiation processes of all kinds using ions, electrons, neutrons, and fission products.We offer here some general comments on the use of TEM to study these materials and give some particular examples of such studies.Thin specimens can be prepared from bulk homogeneous materials in the usual way. Most often, however, amorphous materials are in the form of surface films or interfacial films with different chemistry from the substrates.

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Corrections for surface films in microanalysis by EDS and EELS

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010013078x ◽

1992 ◽

Vol 50 (2) ◽

pp. 1230-1231

Author(s):

J. Bentley ◽

E. A. Kenik

Keyword(s):

Hydrocarbon Contamination ◽

Specimen Preparation ◽

Surface Films ◽

Ion Milling ◽

Preferential Sputtering ◽

Electron Energy Loss Spectrometry ◽

Composition Determination ◽

Analytical Electron ◽

First Order Correction ◽

Electron Energy Loss

Common artifacts on analytical electron microscope (AEM) specimens prepared from bulk materials are surface films with altered structure and composition that result from electropolishing, oxidation, hydrocarbon contamination, or ion milling (preferential sputtering or deposition of sputtered specimen or support material). Of course, the best solution for surface films is to avoid them by improved specimen preparation and handling procedures or to remove them by low energy ion sputter cleaning, a capability that already exists on some specialized AEMs and one that is likely to become increasingly common. However, the problem remains and it is surprising that surface films have not received more attention with respect to composition determination by energy dispersive X-ray spectrometry (EDS) and electron energy loss spectrometry (EELS).For EDS, an effective first-order correction to remove the contribution of surface films on wedge shaped specimens is to subtract from the spectrum of interest a spectrum obtained under identical conditions (probe current, diffracting conditions, acquisition live time) from a thinner region of the specimen.

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Sampling and analysis of the air-water interface with SEM and EDS of microlayers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100157000 ◽

1989 ◽

Vol 47 ◽

pp. 1004-1005

Author(s):

Randall W. Smith ◽

John Dash

Keyword(s):

Heavy Metals ◽

Surface Microlayer ◽

Surface Films ◽

Water Interface ◽

Physical Processes ◽

Infrared Spectroscopic Analysis ◽

Eds Analysis ◽

Air Water Interface ◽

Significant Area ◽

Bulk Chemical

The structure of the air-water interface forms a boundary layer that involves biological ,chemical geological and physical processes in its formation. Freshwater and sea surface microlayers form at the air-water interface and include a diverse assemblage of organic matter, detritus, microorganisms, plankton and heavy metals. The sampling of microlayers and the examination of components is presently a significant area of study because of the input of anthropogenic materials and their accumulation at the air-water interface. The neustonic organisms present in this environment may be sensitive to the toxic components of these inputs. Hardy reports that over 20 different methods have been developed for sampling of microlayers, primarily for bulk chemical analysis. We report here the examination of microlayer films for the documentation of structure and composition.Baier and Gucinski reported the use of Langmuir-Blogett films obtained on germanium prisms for infrared spectroscopic analysis (IR-ATR) of components. The sampling of microlayers has been done by collecting fi1ms on glass plates and teflon drums, We found that microlayers could be collected on 11 mm glass cover slips by pulling a Langmuir-Blogett film from a surface microlayer. Comparative collections were made on methylcel1ulose filter pads. The films could be air-dried or preserved in Lugol's Iodine Several slicks or surface films were sampled in September, 1987 in Chesapeake Bay, Maryland and in August, 1988 in Sequim Bay, Washington, For glass coverslips the films were air-dried, mounted on SEM pegs, ringed with colloidal silver, and sputter coated with Au-Pd, The Langmuir-Blogett film technique maintained the structure of the microlayer intact for examination, SEM observation and EDS analysis were then used to determine organisms and relative concentrations of heavy metals, using a Link AN 10000 EDS system with an ISI SS40 SEM unit. Typical heavy microlayer films are shown in Figure 3.

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