Nanoscale adhesion forces between the fungal pathogen Candida albicans and macrophages

2016 ◽  
Vol 1 (1) ◽  
pp. 69-74 ◽  
Author(s):  
Sofiane El-Kirat-Chatel ◽  
Yves F. Dufrêne

We establish atomic force microscopy as a new nanoscopy platform for quantifying the forces between fungal pathogens and immune cells.

2019 ◽  
Vol 13 (7) ◽  
pp. 1878-1882 ◽  
Author(s):  
Maximilian Mittelviefhaus ◽  
Daniel B. Müller ◽  
Tomaso Zambelli ◽  
Julia A. Vorholt

2016 ◽  
Vol 3 (10) ◽  
pp. 160248 ◽  
Author(s):  
X. Jin ◽  
B. Kasal

This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.


Author(s):  
Christophe Tromas ◽  
Javier Rojo ◽  
Jesús M. de la Fuente ◽  
Africa G. Barrientos ◽  
Ricardo García ◽  
...  

1993 ◽  
Vol 21 (5) ◽  
pp. 1117-1123 ◽  
Author(s):  
Y.L. Lyubchenko ◽  
P.I. Oden ◽  
D. Lampner ◽  
S.M. Lindsay ◽  
K.A. Dunker

2011 ◽  
Vol 17 (S2) ◽  
pp. 1128-1129
Author(s):  
A Vogt ◽  
J Reddel

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2021 ◽  
Vol 2091 (1) ◽  
pp. 012026
Author(s):  
E M Filippova ◽  
U V Nesvizhski ◽  
S A Titov ◽  
A I Glukhov

Abstract Candida albicans is a yeast-like fungus that lives on human mucous membranes and skin and does not cause infections. However, it plays a role in the development of opportunistic infections in immunocompromised people. In this work, we would like to evaluate the possibility of studying the cell wall of C. albicans by atomic force microscopy, as well as compare the operating modes of the microscope and choose optimal one for working with the fungus. Atomic force microscopy is a powerful tool for evaluating surfaces, including the cell walls of biological objects. The microscope is capable of operating in different modes, but in this study we compared two of them: contact and semi-contact. These methods are the most popular for evaluating the surfaces of biological objects. Comparison of the modes was carried out on the C. albicans strain. The surface of the strain was scanned by atomic force microscopy, and the curves of the dependence of the sensor deviation from the distance to the object were recorded. Scanning and recording of curves were carried out in two modes of operation of the microscope: contact and semi-contact, as well as three sensors: soft, medium and hard.


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