Astudy of adhesion forces by atomic force microscopy

2005 ◽  
pp. 309-318
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

Nanoscale adhesion forces between the fungal pathogen Candida albicans and macrophages

2016 ◽  
Vol 1 (1) ◽  
pp. 69-74 ◽  
Author(s):  
Sofiane El-Kirat-Chatel ◽  
Yves F. Dufrêne
Keyword(s):  
Atomic Force Microscopy ◽  
Candida Albicans ◽  
Immune Cells ◽  
Fungal Pathogen ◽  
Fungal Pathogens ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

We establish atomic force microscopy as a new nanoscopy platform for quantifying the forces between fungal pathogens and immune cells.

scholarly journals A modular atomic force microscopy approach reveals a large range of hydrophobic adhesion forces among bacterial members of the leaf microbiota

2019 ◽  
Vol 13 (7) ◽  
pp. 1878-1882 ◽  
Author(s):  
Maximilian Mittelviefhaus ◽  
Daniel B. Müller ◽  
Tomaso Zambelli ◽  
Julia A. Vorholt
Keyword(s):  
Atomic Force Microscopy ◽  
Large Range ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

2016 ◽  
Vol 3 (10) ◽  
pp. 160248 ◽  
Author(s):  
X. Jin ◽  
B. Kasal
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Wood Surface ◽  
Adhesion Force ◽  
Data Interpretation ◽  
Natural Fibre ◽  
Force Distribution ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

Adhesion Forces between LewisX Determinant Antigens as Measured by Atomic Force Microscopy

2001 ◽  
Vol 40 (16) ◽  
pp. 3052-3055 ◽  
Author(s):  
Christophe Tromas ◽  
Javier Rojo ◽  
Jesús M. de la Fuente ◽  
Africa G. Barrientos ◽  
Ricardo García ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Atomic force microscopy of DNA and bacteriophage in air, water and propanol: the role of adhesion forces

1993 ◽  
Vol 21 (5) ◽  
pp. 1117-1123 ◽  
Author(s):  
Y.L. Lyubchenko ◽  
P.I. Oden ◽  
D. Lampner ◽  
S.M. Lindsay ◽  
K.A. Dunker
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Challenges of Working with Active Pharmaceutical Ingredients to Measure Adhesion Forces by Atomic Force Microscopy

2011 ◽  
Vol 17 (S2) ◽  
pp. 1128-1129
Author(s):  
A Vogt ◽  
J Reddel
Keyword(s):  
Atomic Force Microscopy ◽  
Active Pharmaceutical Ingredients ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Pharmaceutical Ingredients ◽  
Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

scholarly journals Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

Atmosphere ◽  
2020 ◽  
Vol 11 (5) ◽  
pp. 489
Author(s):  
Kohei Ono ◽  
Yuki Mizushima ◽  
Masaki Furuya ◽  
Ryota Kunihisa ◽  
Nozomu Tsuchiya ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Aerosol Particles ◽  
Sea Salt ◽  
Dust Particles ◽  
Adhesion Forces ◽  
Distance Curve ◽  
Ambient Particles ◽  
Force Microscopy ◽  
Atomic Force

A new method, namely, force–distance curve mapping, was developed to directly measure the adhesion force of individual aerosol particles by atomic force microscopy. The proposed method collects adhesion force from multiple points on a single particle. It also takes into account the spatial distribution of the adhesion force affected by topography (e.g., the variation in the tip angle relative to the surface, as well as the force imposed upon contact), thereby enabling the direct and quantitative measurement of the adhesion force representing each particle. The topographic effect was first evaluated by measuring Polystyrene latex (PSL) standard particles, and the optimized method was then applied on atmospherically relevant model dust particles (quartz, ATD, and CJ-1) and inorganic particles (ammonium sulfate and artificial sea salt) to inter-compare the adhesion forces among different aerosol types. The method was further applied on the actual ambient aerosol particles collected on the western coast of Japan, when the region was under the influence of Asian dust plume. The ambient particles were classified into sea salt (SS), silicate dust, and Ca-rich dust particles based on individual particle analysis (micro-Raman or Scanning Electron Microscope/Energy Dispersive X-ray Spectroscopy (SEM-EDX)). Comparable adhesion forces were obtained from the model and ambient particles for both SS and silicate dust. Although dust particles tended to show smaller adhesion forces, the adhesion force of Ca-rich dust particles was larger than the majority of silicate dust particles and was comparable with the inorganic salt particles. These results highlight that the original chemical composition, as well as the aging process in the atmosphere, can create significant variation in the adhesion force among individual particles. This study demonstrates that force–distance curve mapping can be used as a new tool to quantitatively characterize the physical properties of aerosol particles on an individual basis.

Adhesion Forces in Conducting Probe Atomic Force Microscopy

Langmuir ◽  
2003 ◽  
Vol 19 (6) ◽  
pp. 1929-1934 ◽  
Author(s):  
Alexei V. Tivanski ◽  
Jason E. Bemis ◽  
Boris B. Akhremitchev ◽  
Haiying Liu ◽  
Gilbert C. Walker
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force
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