Auger electron angular distributions following excitation or ionization from the Xe 3d and F 1s levels in xenon difluoride

Author(s):  
Ruaridh Forbes ◽  
Paul Hockett ◽  
Ivan Powis ◽  
John D. Bozek ◽  
Stephen T. Pratt ◽  
...  

Electron spectroscopy following Xe 3d and F 1s ionization in XeF2 elucidates the influence of core electrons on molecular bonding.

2003 ◽  
Vol 766 ◽  
Author(s):  
Sungjin Hong ◽  
Seob Lee ◽  
Yeonkyu Ko ◽  
Jaegab Lee

AbstractThe annealing of Ag(40 at.% Cu) alloy films deposited on a Si substrate at 200 – 800 oC in vacuum has been conducted to investigate the formation of Cu3Si at the Ag-Si interface and its effects on adhesion and resistivity of Ag(Cu)/Si structure. Auger electron spectroscopy(AES) analysis showed that annealing at 200°C allowed a diffusion of Cu to the Si surface, leading to the significant reduction in Cu concentration in Ag(Cu) film and thus causing a rapid drop in resistivity. In addition, the segregated Cu to the Si surface reacts with Si, forming a continuous copper silicide at the Ag(Cu)/Si interface, which can contribute to an enhanced adhesion of Ag(Cu)/Si annealed at 200 oC. However, as the temperature increases above 300°C, the adhesion tends to decrease, which may be attributed to the agglomeration of copper silicide beginning at around 300°C.


2009 ◽  
Vol 73 (23) ◽  
pp. 7127-7149 ◽  
Author(s):  
Christian Vollmer ◽  
Peter Hoppe ◽  
Frank J. Stadermann ◽  
Christine Floss ◽  
Frank E. Brenker

2021 ◽  
Author(s):  
Cecile COURREGES ◽  
Mélanie Bonnecaze ◽  
Delphine Flahaut ◽  
Sophie Nolivos ◽  
Regis Grimaud ◽  
...  

A chemical fingerprint of Escherichia coli cells surface labeled by gelatin coated gold nanoparticles was obtained by combining Auger Electron Spectroscopy (AES) for single cell level chemical images, and Time-of-Flight...


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