scholarly journals Measurement of the electron beam energy in a source with a plasma anode and the beam extraction into the atmosphere through a foil window

2021 ◽  
Vol 2064 (1) ◽  
pp. 012115
Author(s):  
E N Abdullin ◽  
G F Basov
Keyword(s):  
Electron Beam ◽  
Cross Section ◽  
Voltage Source ◽  
Marx Generator ◽  
Output Window ◽  
Plasma Anode ◽  
Infrared Imager ◽  
Explosive Emission Cathode ◽  
High Voltage Source ◽  
A Current

Abstract Measurements of the energy of an electron beam in an electron beam source with an explosive-emission cathode, a plasma anode and a foil window, providing the extraction of an electron beam with a cross-section of (100–200) cm2 into the atmosphere, have been performed. The high voltage source was a Marx generator based long lines with matched loads. The energy values were calculated from the results of measurements of the temperature of a beam collector placed in vacuum using thermistors and an infrared imager. At an accelerating voltage of ~ 200 kV, a current of (1–2) kA, and an electron beam duration of 5 μs, the maximum values of the energy released in the collector with a cross section of 74 cm2 were (650–850) J/pulse. A decrease in the current and energy of the beam was recorded approximately by a factor of two after passing through an AMG-2n aluminum-magnesium foil with a thickness of 30 μm. The use of infrared imager for recording the beam structure in the plane of the output window in air has been tested.

Energy Distribution in Electron Beams

1972 ◽  
Vol 30 ◽  
pp. 568-569
Author(s):  
Tamotsu Ohno
Keyword(s):  
Electron Beam ◽  
Energy Distribution ◽  
Cross Section ◽  
Integral Curve ◽  
Electron Beams ◽  
Electron Gun ◽  
Angular Divergence ◽  
Apparent Increase ◽  
Integral Width ◽  
The Cross

The energy distribution in an electron; beam from an electron gun provided with a biased Wehnelt cylinder was measured by a retarding potential analyser. All the measurements were carried out with a beam of small angular divergence (<3xl0-4 rad) to eliminate the apparent increase of energy width as pointed out by Ichinokawa.The cross section of the beam from a gun with a tungsten hairpin cathode varies as shown in Fig.1a with the bias voltage Vg. The central part of the beam was analysed. An example of the integral curve as well as the energy spectrum is shown in Fig.2. The integral width of the spectrum ΔEi varies with Vg as shown in Fig.1b The width ΔEi is smaller than the Maxwellian width near the cut-off. As |Vg| is decreased, ΔEi increases beyond the Maxwellian width, reaches a maximum and then decreases. Note that the cross section of the beam enlarges with decreasing |Vg|.

Searching for the causes why some of the paintings by Mihaly Munkacsy are darkening

1990 ◽  
Vol 48 (2) ◽  
pp. 204-205
Author(s):  
Imre Pozsgai ◽  
Klara Erdöhalmi-Torok
Keyword(s):  
Electron Beam ◽  
Cross Section ◽  
Polyester Resin ◽  
National Gallery ◽  
X Ray ◽  
Art Historians ◽  
Made In ◽  
Grinding And Polishing

The paintings by the great Hungarian master Mihaly Munkacsy (1844-1900) made in an 8-9 years period of his activity are deteriorating. The most conspicuous sign of the deterioration is an intensive darkening. We have made an attempt by electron beam microanalysis to clarify the causes of the darkening. The importance of a study like this is increased by the fact that a similar darkening can be observed on the paintings by Munkacsy’s contemporaries e.g Courbet and Makart. A thick brown mass the so called bitumen used by Munkacsy for grounding and also as a paint is believed by the art historians to cause the darkening.For this study, paint specimens were taken from the following paintings: “Studio”, “Farewell” and the “Portrait of the Master’s Wife”, all of them are the property of the Hungarian National Gallery. The paint samples were embedded in a polyester resin “Poly-Pol PS-230” and after grinding and polishing their cross section was used for x-ray mapping.

The use of an energy-filtering electron microscope to reduce chromatic aberration in images of thick biological specimens

1986 ◽  
Vol 44 ◽  
pp. 88-91
Author(s):  
L. D. Peachey ◽  
J. P. Heath ◽  
G. Lamprecht
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Cross Section ◽  
Electron Scattering ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Incident Electron Energy ◽  
Energy Filtering ◽  
Transmission Electron

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.

scholarly journals Transient Current Density in a Pair of Long Parallel Conductors

2021 ◽  
Vol 11 (15) ◽  
pp. 6920
Author(s):  
Oldřich Coufal
Keyword(s):  
Steady State ◽  
Cross Section ◽  
Current Density ◽  
Circular Cross Section ◽  
Transient Current ◽  
Constant Current ◽  
Voltage Source ◽  
Sinusoidal Voltage ◽  
Steady State Current ◽  
Maximum Current

Two infinitely long parallel conductors of arbitrary cross section connected to a voltage source form a loop. If the source voltage depends on time, then due to induction there is no constant current density in the loop conductors. It is only recently that a method has been published for accurately calculating current density in a group of long parallel conductors. The method has thus far been applied to the calculation of steady-state current density in a loop connected to a sinusoidal voltage source. In the present article, the method is used for an accurate calculation of transient current using transient current density. The transient current is analysed when connecting and short-circuiting the sources of sinusoidal, constant and sawtooth voltages. For circular cross section conductors, the dependences of maximum current density, maximum current and the time of achieving steady state on the source frequency, the distance of the conductors and their resistivity when connecting the source of sinusoidal voltage are examined.

EXEELFS (Extended Electron Energy Loss Fine Structure) Study of Tin Grown by the DC Sputtering Technique.

2000 ◽  
Vol 6 (S2) ◽  
pp. 226-227
Author(s):  
Duarte-Moller A. ◽  
F. Espinosa-Maganña ◽  
R. Martínez-S´anchez ◽  
O. Contreras
Keyword(s):  
Energy Loss ◽  
Direct Current ◽  
Physical Vapor Deposition ◽  
Standard Procedure ◽  
High Energy ◽  
Structure Study ◽  
Voltage Source ◽  
Titanium Target ◽  
High Voltage Source ◽  
Mechanical Pump

Titanium nitride coatings were grown in a physical vapor deposition system assisted by a direct current reactive magnetron sputtering technique. The vacuum chamber was evacuated with a mechanical pump and cryopump to a base pressure of 10-7 Torr. The Sputtering was performed with a direct current high voltage source (0-1 Kev and 1 A) on a titanium target (99.98% purity). The titanium target was sputtered with a high purity argon -nitrogen mixture. The films were deposited on monocrystalline silicon (mc-Si) (111) substrates at different nitrogen partial pressures from 0.08 mTorr to 1.5 mTorr. Total pressure, power applied to target and substrate temperature were keep constant in all the experiments.EXEELFS analysis were done using the standard procedure [1,2]. In this case, we are find that the atomic concentration is in good agreement with the respective established stoichioinetry N/T=0.99. Figure 1 shows the window of high energy loss where appears their respective N K-edge and Ti -L23.

Numerical Simulation of the Effects of Preheating on Electron Beam Additive Manufactured Ti-6Al-4V Build Plate

2016 ◽  
Vol 879 ◽  
pp. 274-278 ◽  
Author(s):  
Jun Cao ◽  
Philip Nash
Keyword(s):  
Numerical Simulation ◽  
Residual Stress ◽  
Finite Element ◽  
Electron Beam ◽  
Cross Section ◽  
Element Model ◽  
Normal Direction ◽  
Thermal Residual Stresses ◽  
Longitudinal Residual Stress ◽  
Middle Cross Section

In an earlier study, a 3-D thermomechanical coupled finite element model was built and experimentally validated to investigate the evolution of the thermal residual stresses and distortions in electron beam additive manufactured Ti-6Al-4V build plates. In this study, an investigation using this robust and accurate model was focused on an efficient preheating method, in which the electron beam quickly scanned across the substrate to preheat the build plate prior to the deposition. Various preheat times, beam powers, scan rates, scanning paths and cooling times (between the end of current preheat scan/deposition layer and the beginning of the next preheat scan/deposition layer) were examined, and the maximum distortion along the centerline of the substrate and the maximum longitudinal residual stress along the normal direction on the middle cross-section of the build plate were quantitatively compared. The results show that increasing preheat times and beam powers could effectively reduce both distortion and residual stress for multiple layers/passes components.

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