Low Power Test Compression Technique for Designs with Multiple Scan Chain

2005 ◽  
Author(s):  
Youhua Shi ◽  
N. Togawa ◽  
M. Yanagisawa ◽  
T. Ohtsuki ◽  
S. Kimura
Keyword(s):  
Low Power ◽  
Compression Technique ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
Multiple Scan ◽  
Scan Chain

Low Power Test Compression with Programmable Broadcast-Based Control

2014 ◽  
Author(s):  
Sylwester Milewski ◽  
Grzegorz Mrugalski ◽  
Janusz Rajski ◽  
Jerzy Tyszer
Keyword(s):  
Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test

LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs

2018 ◽  
Vol 34 (6) ◽  
pp. 685-695 ◽  
Author(s):  
Haiying Yuan ◽  
Changshi Zhou ◽  
Xun Sun ◽  
Kai Zhang ◽  
Tong Zheng ◽  
...  
Keyword(s):  
Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
Lfsr Reseeding

Access-in-turn test architecture for low-power test application

2016 ◽  
Vol 104 (3) ◽  
pp. 433-441 ◽  
Author(s):  
Weizheng Wang ◽  
JinCheng Wang ◽  
Zengyun Wang ◽  
Lingyun Xiang
Keyword(s):  
Low Power ◽  
Power Test ◽  
Low Power Test ◽  
Test Application ◽  
Test Architecture

A low power test pattern generation for built-in self-test based circuits

2011 ◽  
Vol 98 (3) ◽  
pp. 301-309 ◽  
Author(s):  
Bo Ye ◽  
Tianwang Li ◽  
Qian Zhao ◽  
Duo Zhou ◽  
Xiaohua Wang ◽  
...  
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Power Test ◽  
Low Power Test ◽  
Self Test ◽  
Built In Self Test
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