A novel on-chip mismatch measurement technique for Nyquist rate ADCs

2018 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) ◽

10.1109/edaps.2018.8680875 ◽

2018 ◽

Author(s):

Ankur BAL ◽

Vikram SINGH

Keyword(s):

Measurement Technique ◽

Nyquist Rate ◽

On Chip

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Precision measurement technique of integrated MOS capacitor mismatching using a simple on-chip circuit

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1986.22599 ◽

1986 ◽

Vol 33 (7) ◽

pp. 938-944 ◽

Cited By ~ 12

Author(s):

M. Furukawa ◽

H. Hatano ◽

K. Hanihara

Keyword(s):

Measurement Technique ◽

Precision Measurement ◽

Mos Capacitor ◽

On Chip

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On-chip jitter tolerance measurement technique with independent jitter frequency modulation from VCO in CDR

IEICE Electronics Express ◽

10.1587/elex.12.20150570 ◽

2015 ◽

Vol 12 (15) ◽

pp. 20150570-20150570

Author(s):

Kyung-Sub Son ◽

Jin-Ku Kang

Keyword(s):

Measurement Technique ◽

Frequency Modulation ◽

Jitter Tolerance ◽

On Chip

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On-Chip Supply Voltage Measurement Technique

APCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems ◽

10.1109/apccas.2006.342497 ◽

2006 ◽

Author(s):

Ma Fan Yung

Keyword(s):

Measurement Technique ◽

Supply Voltage ◽

Voltage Measurement ◽

On Chip

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Charge-based on-chip measurement technique for the selective extraction of cross-coupling capacitances

Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects ◽

10.1109/spi.2002.258287 ◽

2002 ◽

Cited By ~ 9

Author(s):

Alessandro Bogliolo ◽

Loris Vendrame ◽

Luca Bortesi ◽

Ezio Barachetti

Keyword(s):

Measurement Technique ◽

Cross Coupling ◽

Selective Extraction ◽

On Chip

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An on-chip short-time interval measurement technique for testing high-speed communication links

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923466 ◽

2002 ◽

Cited By ~ 4

Author(s):

Jiun-Lang Huang ◽

Kwang-Ting Cheng

Keyword(s):

Measurement Technique ◽

High Speed ◽

Time Interval ◽

Short Time Interval ◽

Interval Measurement ◽

Communication Links ◽

Time Interval Measurement ◽

On Chip ◽

Short Time

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A Precision On-Chip Measurement Technique for Dielectric Absorption of an Integrated Capacitor

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2013.2291951 ◽

2014 ◽

Vol 63 (6) ◽

pp. 1613-1619 ◽

Cited By ~ 2

Author(s):

Young-Cheon Kwon ◽

Oh-Kyong Kwon

Keyword(s):

Measurement Technique ◽

Dielectric Absorption ◽

On Chip

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On-chip small capacitor mismatches measurement technique using beta-multiplier-biased ring oscillator

2009 IEEE Asian Solid-State Circuits Conference ◽

10.1109/asscc.2009.5357165 ◽

2009 ◽

Cited By ~ 7

Author(s):

Sai-Weng Sin ◽

He-Gong Wei ◽

U-Fat Chio ◽

Yan Zhu ◽

U Seng-Pan ◽

...

Keyword(s):

Measurement Technique ◽

Ring Oscillator ◽

On Chip

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An On-Chip Delay Measurement Technique Using Signature Registers for Small-Delay Defect Detection

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2011.2125994 ◽

2012 ◽

Vol 20 (5) ◽

pp. 804-817 ◽

Cited By ~ 8

Author(s):

K. Katoh ◽

K. Namba ◽

H. Ito

Keyword(s):

Defect Detection ◽

Measurement Technique ◽

Delay Measurement ◽

Small Delay ◽

On Chip

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An on-chip coupling capacitance measurement technique

VLSI Design 2001. Fourteenth International Conference on VLSI Design ◽

10.1109/icvd.2001.902707 ◽

2002 ◽

Cited By ~ 1

Author(s):

P.A. Nair ◽

A. Gupta ◽

M.P. Desai

Keyword(s):

Measurement Technique ◽

Capacitance Measurement ◽

Coupling Capacitance ◽

On Chip

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On-chip jitter tolerance measurement technique for CDR circuits

2015 IEEE International Symposium on Circuits and Systems (ISCAS) ◽

10.1109/iscas.2015.7168955 ◽

2015 ◽

Cited By ~ 2

Author(s):

Kyung-Sub Son ◽

Kyongsu Lee ◽

Jin-Ku Kang

Keyword(s):

Measurement Technique ◽

Jitter Tolerance ◽

On Chip

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