A Novel Process Variation Model for Test Cost Reduction in Wafers with Addressable Monitoring Structures

Author(s):  
Gui-Feng Ren ◽  
Zheng Shi
Author(s):  
Youngkwang Lee ◽  
Young-woo Lee ◽  
Sungyoul Seo ◽  
Sungho Kang

Author(s):  
Muhammad Ibtesam ◽  
Umair Saeed Solangi ◽  
Jinuk Kim ◽  
Muhammad Adil Ansari ◽  
Sungju Park

2011 ◽  
Vol 8 (16) ◽  
pp. 1367-1373 ◽  
Author(s):  
Zhiqiang You ◽  
Weizheng Wang ◽  
Zhiping Dou ◽  
Peng Liu ◽  
Jishun Kuang

Author(s):  
T. Hiraide ◽  
Kwame Osei Boateng ◽  
H. Konishi ◽  
K. Itaya ◽  
M. Emori ◽  
...  

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