Test Scheduling and Test Time Reduction for SoC by Using Enhanced Firefly Algorithm

System-on-Chip (SoC) is an integration of electronic components and billions of transistors. Defects due to the base material is caused during the manufacturing of components. To overcome these issues testing of chips is necessary but total cost increases because of increasing test time. The main issues to be considered during testing of SoC are the time taken for testing and accessibility of core. Effective test scheduling should be done to minimize testing time. In this paper, an effective test scheduling mechanism to minimize testing time is proposed. The test time reduction causes test cost reduction. The Enhanced Firefly algorithm is used in this paper to minimize test time. Enhanced Firefly algorithm gives a better result than Ant colony and Firefly algorithms in terms of test time reduction thereby reduction test cost takes place.

An Effective Regression Test Case Selection Using Hybrid Whale Optimization Algorithm

Test suite optimization is an ever-demanded approach for regression test cost reduction. Regression testing is conducted to identify any adverse effects of maintenance activity on previously working versions of the software. It consumes almost seventy percent of the overall software development lifecycle budget. Regression test cost reduction is therefore of vital importance. Test suite optimization is the most explored approach to reduce the test suite size to re-execute. This article focuses on test suite optimization as a regression test case selection, which is a proven N-P hard combinatorial optimization problem. The authors have proposed an almost safe regression test case selection approach using a Hybrid Whale Optimization Algorithm and empirically evaluated the same on subject programs retrieved from the Software Artifact Infrastructure Repository with Bat Search and ACO-based regression test case selection approaches. The analyses of the obtained results indicate an improvement in the fault detection ability of the proposed approach over the compared ones with significant reduction in test suite size.