Studying the Reliability of Ge nFinFETs by the Normalized Input-referred Voltage Noise

Author(s):  
Duan Xie ◽  
Eddy Simoen ◽  
Hiroaki Arimura
Keyword(s):  
1994 ◽  
Vol 49 (22) ◽  
pp. 15813-15829 ◽  
Author(s):  
B. Plaçais ◽  
P. Mathieu ◽  
Y. Simon

1993 ◽  
Vol 62 (20) ◽  
pp. 2575-2577
Author(s):  
M. Hatle ◽  
T. Kondo ◽  
K. Hamasaki
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2014 ◽  
Vol 45 (10) ◽  
pp. 1348-1353
Author(s):  
Elena I. Vătăjelu ◽  
Álvaro Gómez-Pau ◽  
Michel Renovell ◽  
Joan Figueras

2000 ◽  
Vol 341-348 ◽  
pp. 1225-1226
Author(s):  
A. Taoufik ◽  
S. Senoussi ◽  
A. Tirbiyine ◽  
A. Ramzi

2018 ◽  
Vol 17 (1) ◽  
pp. 68-71 ◽  
Author(s):  
Zacharias Hadjilambrou ◽  
Shidhartha Das ◽  
Marco A. Antoniades ◽  
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Keyword(s):  

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