Studying the Reliability of Ge nFinFETs by the Normalized Input-referred Voltage Noise
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2000 ◽
Vol 284-288
◽
pp. 981-982
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1994 ◽
Vol 49
(22)
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pp. 15813-15829
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2018 ◽
Vol 17
(1)
◽
pp. 68-71
◽
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