Closed-form analytical drain current model considering energy transport and self-heating for short-channel fully-depleted SOi NMOS devices with lightly-doped drain structure biased in strong inversion
2002 ◽
Vol 49
(12)
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pp. 2193-2203
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1995 ◽
Vol 38
(12)
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pp. 2051-2057
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2019 ◽
Vol 9
(2)
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pp. 291-297
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1995 ◽
Vol 79
(3)
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pp. 293-301
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2013 ◽
Vol 60
(3)
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pp. 1122-1127
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2019 ◽
Vol 14
(6)
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pp. 868-876
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1998 ◽
Vol 37
(Part 1, No. 1)
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pp. 64-71
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Keyword(s):
2003 ◽
Vol 43
(2)
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pp. 333-338
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