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Fault tuples in diagnosis of deep-submicron circuits
Proceedings. International Test Conference
◽
10.1109/test.2002.1041765
◽
2003
◽
Cited By ~ 32
Author(s):
R.D. Blanton
◽
J.T. Chen
◽
R. Desineni
◽
K.N. Dwarakanath
◽
W. Maly
◽
...
Keyword(s):
Deep Submicron
◽
Deep Submicron Circuits
Download Full-text
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References
WTA - Waveform-based Timing Analysis for deep submicron circuits
IEEE/ACM International Conference on Computer Aided Design, 2002. ICCAD 2002.
◽
10.1109/iccad.2002.1167598
◽
2003
◽
Cited By ~ 3
Author(s):
L. McMurchie
◽
C. Sechen
Keyword(s):
Timing Analysis
◽
Deep Submicron
◽
Deep Submicron Circuits
Download Full-text
An integrated logical and physical design flow for deep submicron circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/43.784122
◽
1999
◽
Vol 18
(9)
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pp. 1305-1315
◽
Cited By ~ 11
Author(s):
A.H. Salek
◽
Jinan Lou
◽
M. Pedram
Keyword(s):
Deep Submicron
◽
Physical Design
◽
Design Flow
◽
Deep Submicron Circuits
Download Full-text
A robust DC current generation and measurement technique for deep submicron circuits
ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196)
◽
10.1109/iscas.2001.921957
◽
2002
◽
Cited By ~ 1
Author(s):
C.K.L. Tam
◽
G.W. Roberts
Keyword(s):
Measurement Technique
◽
Deep Submicron
◽
Current Generation
◽
Dc Current
◽
Deep Submicron Circuits
Download Full-text
Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density
The 2006 IEEE International Joint Conference on Neural Network Proceedings
◽
10.1109/ijcnn.2006.1716473
◽
2006
◽
Cited By ~ 4
Author(s):
M. Stanisavljevic
◽
A. Schmid
◽
Y. Leblebici
Keyword(s):
Fault Tolerance
◽
Defect Density
◽
Deep Submicron
◽
Feed Forward
◽
Deep Submicron Circuits
Download Full-text
Enhanced power gating schemes for low leakage low ground bounce noise in deep submicron circuits
2012 International Conference on Devices, Circuits and Systems (ICDCS)
◽
10.1109/icdcsyst.2012.6188736
◽
2012
◽
Cited By ~ 3
Author(s):
C. Saxena
◽
M. Pattanaik
◽
R. K. Tiwari
Keyword(s):
Deep Submicron
◽
Power Gating
◽
Low Leakage
◽
Ground Bounce
◽
Deep Submicron Circuits
Download Full-text
Leakage control for deep-submicron circuits
10.1117/12.498181
◽
2003
◽
Cited By ~ 3
Author(s):
Kaushik Roy
◽
Hamid Mahmoodi-Meimand
◽
Saibal Mukhopadhyay
Keyword(s):
Deep Submicron
◽
Leakage Control
◽
Deep Submicron Circuits
Download Full-text
Requirements for practical I/sub DDQ/ testing of deep submicron circuits
Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637)
◽
10.1109/dbt.2000.843685
◽
2002
◽
Cited By ~ 8
Author(s):
D.M.H. Walker
Keyword(s):
Deep Submicron
◽
Deep Submicron Circuits
Download Full-text
Leakage power estimation for deep submicron circuits in an ASIC design environment
Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design Automation Conference and 15h International Conference on VLSI Design
◽
10.1109/aspdac.2002.994883
◽
2003
◽
Cited By ~ 13
Author(s):
R. Kumar
◽
C.P. Ravikumar
Keyword(s):
Power Estimation
◽
Deep Submicron
◽
Leakage Power
◽
Design Environment
◽
Asic Design
◽
Deep Submicron Circuits
Download Full-text
Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density
The 2006 IEEE International Joint Conference on Neural Network Proceedings
◽
10.1109/ijcnn.2006.247183
◽
2006
◽
Cited By ~ 6
Author(s):
M. Stanisavljevic
◽
A. Schmid
◽
Y. Leblebici
Keyword(s):
Fault Tolerance
◽
Defect Density
◽
Deep Submicron
◽
Feed Forward
◽
Deep Submicron Circuits
Download Full-text
Dynamic power estimation for deep submicron circuits with process variation
2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)
◽
10.1109/aspdac.2010.5419818
◽
2010
◽
Cited By ~ 8
Author(s):
Quang Dinh
◽
Deming Chen
◽
Martin D. F. Wong
Keyword(s):
Process Variation
◽
Power Estimation
◽
Deep Submicron
◽
Dynamic Power
◽
Deep Submicron Circuits
Download Full-text
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