Leakage control for deep-submicron circuits

Mapping Intimacies ◽

10.1117/12.498181 ◽

2003 ◽

Author(s):

Kaushik Roy ◽

Hamid Mahmoodi-Meimand ◽

Saibal Mukhopadhyay

Keyword(s):

Deep Submicron ◽

Leakage Control ◽

Deep Submicron Circuits

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WTA - Waveform-based Timing Analysis for deep submicron circuits

IEEE/ACM International Conference on Computer Aided Design, 2002. ICCAD 2002. ◽

10.1109/iccad.2002.1167598 ◽

2003 ◽

Author(s):

L. McMurchie ◽

C. Sechen

Keyword(s):

Timing Analysis ◽

Deep Submicron ◽

Deep Submicron Circuits

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An integrated logical and physical design flow for deep submicron circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.784122 ◽

1999 ◽

Vol 18 (9) ◽

pp. 1305-1315 ◽

Author(s):

A.H. Salek ◽

Jinan Lou ◽

M. Pedram

Keyword(s):

Deep Submicron ◽

Physical Design ◽

Design Flow ◽

Deep Submicron Circuits

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A robust DC current generation and measurement technique for deep submicron circuits

ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196) ◽

10.1109/iscas.2001.921957 ◽

2002 ◽

Author(s):

C.K.L. Tam ◽

G.W. Roberts

Keyword(s):

Measurement Technique ◽

Deep Submicron ◽

Current Generation ◽

Deep Submicron Circuits

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Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density

The 2006 IEEE International Joint Conference on Neural Network Proceedings ◽

10.1109/ijcnn.2006.1716473 ◽

2006 ◽

Author(s):

M. Stanisavljevic ◽

A. Schmid ◽

Y. Leblebici

Keyword(s):

Fault Tolerance ◽

Defect Density ◽

Deep Submicron ◽

Feed Forward ◽

Deep Submicron Circuits

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Enhanced power gating schemes for low leakage low ground bounce noise in deep submicron circuits

2012 International Conference on Devices, Circuits and Systems (ICDCS) ◽

10.1109/icdcsyst.2012.6188736 ◽

2012 ◽

Author(s):

C. Saxena ◽

M. Pattanaik ◽

R. K. Tiwari

Keyword(s):

Deep Submicron ◽

Power Gating ◽

Low Leakage ◽

Ground Bounce ◽

Deep Submicron Circuits

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Requirements for practical I/sub DDQ/ testing of deep submicron circuits

Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637) ◽

10.1109/dbt.2000.843685 ◽

2002 ◽

Author(s):

D.M.H. Walker

Keyword(s):

Deep Submicron ◽

Deep Submicron Circuits

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Leakage power estimation for deep submicron circuits in an ASIC design environment

Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design Automation Conference and 15h International Conference on VLSI Design ◽

10.1109/aspdac.2002.994883 ◽

2003 ◽

Author(s):

R. Kumar ◽

C.P. Ravikumar

Keyword(s):

Power Estimation ◽

Deep Submicron ◽

Leakage Power ◽

Design Environment ◽

Asic Design ◽

Deep Submicron Circuits

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Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density

The 2006 IEEE International Joint Conference on Neural Network Proceedings ◽

10.1109/ijcnn.2006.247183 ◽

2006 ◽

Author(s):

M. Stanisavljevic ◽

A. Schmid ◽

Y. Leblebici

Keyword(s):

Fault Tolerance ◽

Defect Density ◽

Deep Submicron ◽

Feed Forward ◽

Deep Submicron Circuits

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Fault tuples in diagnosis of deep-submicron circuits

Proceedings. International Test Conference ◽

10.1109/test.2002.1041765 ◽

2003 ◽

Author(s):

R.D. Blanton ◽

J.T. Chen ◽

R. Desineni ◽

K.N. Dwarakanath ◽

W. Maly ◽

...

Keyword(s):

Deep Submicron ◽

Deep Submicron Circuits

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Dynamic power estimation for deep submicron circuits with process variation

2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2010.5419818 ◽

2010 ◽

Author(s):

Quang Dinh ◽

Deming Chen ◽

Martin D. F. Wong

Keyword(s):

Process Variation ◽

Power Estimation ◽

Deep Submicron ◽

Dynamic Power ◽

Deep Submicron Circuits

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