Utilization of Thin-film to Control Total Phase Shift during Total-internal-reflection

2020 IEEE International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE) ◽

10.1109/wiecon-ece52138.2020.9398045 ◽

2020 ◽

Author(s):

Moumita Saha ◽

Sumita Deb ◽

Bhaswati Medhi ◽

Minakshi Deb Barma

Keyword(s):

Thin Film ◽

Phase Shift ◽

Total Internal Reflection ◽

Internal Reflection ◽

Total Phase

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Observation and control of thin-film defects using in-situ total-internal-reflection microscopy

10.1117/12.60111 ◽

1992 ◽

Cited By ~ 4

Author(s):

Forrest L. Williams ◽

Gary A. Peterson, Jr. ◽

Reed A. Schmell ◽

Charles K. Carniglia

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Internal Reflection ◽

Total Internal Reflection Microscopy ◽

And Control

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Highly Sensitive Terahertz Thin-Film Total Internal Reflection Spectroscopy Reveals in Situ Photoinduced Structural Changes in Methylammonium Lead Halide Perovskites

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.8b05695 ◽

2018 ◽

Vol 122 (30) ◽

pp. 17552-17558 ◽

Cited By ~ 11

Author(s):

Qiushuo Sun ◽

Xudong Liu ◽

Jie Cao ◽

Rayko I. Stantchev ◽

Yang Zhou ◽

...

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Structural Changes ◽

Internal Reflection ◽

Reflection Spectroscopy ◽

Highly Sensitive ◽

Halide Perovskites ◽

Internal Reflection Spectroscopy ◽

Lead Halide

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High-precision interference measurements of phase shift between orthogonal linear polarized beams at total internal reflection

Fourteenth International Conference on Correlation Optics ◽

10.1117/12.2553965 ◽

2020 ◽

Author(s):

Oleg V. Angelsky ◽

Alexander Y. Bekshaev ◽

Elena I. Kurek ◽

Andrew P. Maksimyak ◽

Peter P. Maksimyak ◽

...

Keyword(s):

Phase Shift ◽

High Precision ◽

Total Internal Reflection ◽

Internal Reflection ◽

Polarized Beams ◽

Interference Measurements

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Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell

Review of Scientific Instruments ◽

10.1063/1.5058218 ◽

2019 ◽

Vol 90 (4) ◽

pp. 045118 ◽

Cited By ~ 2

Author(s):

Tengxiao Ma ◽

Leping Zhou ◽

Xiaoze Du ◽

Yongping Yang

Keyword(s):

Thin Film ◽

Fluorescence Microscopy ◽

Film Thickness ◽

Total Internal Reflection ◽

Disjoining Pressure ◽

Internal Reflection ◽

Total Internal Reflection Fluorescence ◽

Thin Film Thickness ◽

Simultaneous Measurements

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Comment to the paper “Light scattering in porous materials: Geometrical optics and stereological approach”–Phase shift between the parallel and perpendicular components in total internal reflection

Journal of Quantitative Spectroscopy and Radiative Transfer ◽

10.1016/j.jqsrt.2014.05.018 ◽

2014 ◽

Vol 147 ◽

pp. 60-62

Author(s):

Aleksey V. Malinka

Keyword(s):

Light Scattering ◽

Phase Shift ◽

Porous Materials ◽

Total Internal Reflection ◽

Geometrical Optics ◽

Internal Reflection ◽

Approach Phase

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Tunneling of X-ray photons through a thin film under total internal reflection conditions

JETP Letters ◽

10.1134/1.1996755 ◽

2005 ◽

Vol 81 (10) ◽

pp. 491-493

Author(s):

A. G. Touriyanskii ◽

I. V. Pirshin

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Internal Reflection ◽

X Ray

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Development of laser induced breakdown spectrometer with total internal reflection surface for thin film analysys

25th International Symposium on Atmospheric and Ocean Optics: Atmospheric Physics ◽

10.1117/12.2540904 ◽

2019 ◽

Author(s):

Nikolay Dostovalov

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Internal Reflection ◽

Laser Induced Breakdown

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Loss-Induced Resonant Refractive Index Sensing using Total Internal Reflection Phase Shift

2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) ◽

10.1109/cleoe-eqec.2019.8871722 ◽

2019 ◽

Author(s):

Markus Miller ◽

Rainer Michalzik ◽

Karl Joachim Ebeling ◽

Susanne Menzel

Keyword(s):

Refractive Index ◽

Phase Shift ◽

Total Internal Reflection ◽

Internal Reflection ◽

Refractive Index Sensing ◽

Reflection Phase

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Optical bistability of a dielectric cladded thin film near the total internal reflection state: theory and experiment

10.1364/cleo.1985.tum2 ◽

1985 ◽

Author(s):

I. C. KHOO ◽

J. Y. HOU

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Optical Bistability ◽

State Theory ◽

Internal Reflection ◽

Theory And Experiment

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Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film

Journal of the Optical Society of America A ◽

10.1364/josaa.23.000960 ◽

2006 ◽

Vol 23 (4) ◽

pp. 960 ◽

Cited By ~ 11

Author(s):

R. M. A. Azzam

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Phase Shifts ◽

Internal Reflection ◽

Frustrated Total Internal Reflection ◽

Optical Tunneling

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