X-Ray Refraction Characterization of the Interface Structure of Ceramics

2000 ◽  
Author(s):  
Manfred P. Hentschel ◽  
Karl-Wolfram Harbich ◽  
Joerg Schors ◽  
Axel Lange
Keyword(s):  
High Performance ◽  
Ceramic Composites ◽  
Interface Structure ◽  
X Rays ◽  
X Ray ◽  
Surfaces And Interfaces ◽  
X Ray Scattering ◽  
Monolithic Ceramics ◽  
Nondestructive Characterization

Advanced ceramics require specific methods for their nondestructive characterization. X-ray refraction techniques determine the specific surfaces and interfaces of high performance ceramics, composites and other low density materials down to nano-meter dimensions. X-ray refraction occurs due to the interference of phase shifted X-rays in ultra small angle X-ray scattering (USAXS) at objects above 100 nm size. Applications to monolithic ceramics and ceramic composites are presented. The well localized mean pore size of ceramics and the crack growth of ceramic composites are measured non-destructively.

scholarly journals Characterization of SiGe thin films using a laboratory X-ray instrument

2013 ◽  
Vol 46 (4) ◽  
pp. 898-902 ◽  
Author(s):  
Tatjana Ulyanenkova ◽  
Maksym Myronov ◽  
Andrei Benediktovitch ◽  
Alexander Mikhalychev ◽  
John Halpin ◽  
...  
Keyword(s):  
Epitaxial Films ◽  
Reciprocal Space ◽  
X Rays ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Material Parameters ◽  
X Ray Scattering ◽  
Laboratory Source ◽  
Nondestructive Characterization

The technique of reciprocal space mapping using X-rays is a recognized tool for the nondestructive characterization of epitaxial films. X-ray scattering from epitaxial Si0.4Ge0.6 films on Si(100) substrates using a laboratory X-ray source was investigated. It is shown that a laboratory source with a rotating anode makes it possible to investigate the material parameters of the super-thin 2–6 nm layers. For another set of partially relaxed layers, 50–200 nm thick, it is shown that from a high-resolution reciprocal space map, conditioned from diffuse scattering on dislocations, it is possible to determine quantitatively from the shape of a diffraction peak (possessing no thickness fringes) additional parameters such as misfit dislocation density and layer thickness as well as concentration and relaxation.

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

X-ray Scattering from Interfaces

1991 ◽  
Vol 237 ◽  
Author(s):  
E. Vlieg ◽  
H. A. Van Der Vegt
Keyword(s):  
Epitaxial Growth ◽  
Surface Structures ◽  
X Rays ◽  
X Ray Diffraction ◽  
General Outline ◽  
X Ray ◽  
Buried Interfaces ◽  
X Ray Scattering ◽  
High Penetration

ABSTRACTX-ray diffraction has found an increasing use in the characterization of surface structures. Due to the high penetration depth of X-rays, the technique is also very suitable for the study of buried interfaces. We will give a general outline of the technique, and then discuss two examples concerning epitaxial growth.

X-ray scattering from surfaces and interfaces and its application to the characterization of CaF2Si(111) interfaces

1996 ◽  
Vol 163 (1-2) ◽  
pp. 31-38 ◽  
Author(s):  
J. Harada ◽  
I. Takahashi ◽  
Y. Itoh ◽  
N.S. Sokolov ◽  
N.L. Yakovlev ◽  
...  
Keyword(s):  
X Ray ◽  
Surfaces And Interfaces ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Decoupling the Contributions of ZnO and Silica in the Characterization of Industrially-Mixed Filled Rubbers by Combining Small Angle Neutron and X-Ray Scattering

Polymers ◽  
2020 ◽  
Vol 12 (3) ◽  
pp. 502
Author(s):  
Mariapaola Staropoli ◽  
Dominik Gerstner ◽  
Aurel Radulescu ◽  
Michael Sztucki ◽  
Benoit Duez ◽  
...  
Keyword(s):  
X Rays ◽  
Rubber Mixture ◽  
Nano Structure ◽  
X Ray ◽  
X Ray Scattering ◽  
Silica Filler ◽  
Structure Factors ◽  
The Hierarchical Structure ◽  
Ray Scattering

Scattering techniques with neutrons and X-rays are powerful methods for the investigation of the hierarchical structure of reinforcing fillers in rubber matrices. However, when using only X-ray scattering, the independent determination of the filler response itself sometimes remains an issue because of a strong parasitic contribution of the ZnO catalyst and activator in the vulcanization process. Microscopic characterization of filler-rubber mixtures even with only catalytic amounts of ZnO is, therefore, inevitably complex. Here, we present a study of silica aggregates dispersed in an SBR rubber in the presence of the catalyst and show that accurate partial structure factors of both components can be determined separately from the combination of the two scattering probes, neutrons, and X-rays. A unique separation of the silica filler scattering function devoid of parasitic catalyst scattering becomes possible. From the combined analysis, the catalyst contribution is determined as well and results to be prominent in the correction scheme. The experimental nano-structure of the ZnO after the mixing process as the by-product of the scattering decomposition was found also to be affected by the presence or absence of silica in the rubber mixture, correlated with the shear forces in the mixing and milling processes during sample preparation. The presented method is well suited for studies of novel dual filler systems.

scholarly journals A combined characterization of clusters in naturally aged Al–Cu–(Li, Mg) alloys using small-angle neutron and X-ray scattering and atom probe tomography

2017 ◽  
Vol 50 (6) ◽  
pp. 1725-1734 ◽  
Author(s):  
R. Ivanov ◽  
A. Deschamps ◽  
F. De Geuser
Keyword(s):  
Small Angle ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
X Rays ◽  
Contrast Variation ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Aged State

A new methodology for the characterization of solute clusters leading to compositional fluctuations is presented and discussed. The methodology makes use of contrast variation arising from a combination of small-angle scattering using neutrons and X-rays, and adapts a model for solute correlation to extract the chemistry and length scale of clustered states after quench and after natural ageing. In three subsets of the Al–Cu system, Cu-rich clusters are reported for all cases. The presence of Mg strongly enhances Cu clustering in the naturally aged state and results in more than double the number of clusters in the complex Al–Cu–Li–Mg system. The results are compared with those obtained using atom probe tomography.

Sign in / Sign up

Export Citation Format

Share Document