Surface characterization of sputtered niobium films by scanning tunneling microscopy
1994 ◽
Vol 12
(3)
◽
pp. 1734
◽
1999 ◽
Vol 147
(1-4)
◽
pp. 140-145
◽
1993 ◽
Vol 28
(1-2)
◽
pp. 1-121
◽
1993 ◽
Vol 31
(1)
◽
pp. 23-27
◽
2001 ◽
Vol 78-79
◽
pp. 183-190
◽
2000 ◽
Vol 194-195
◽
pp. 129-136
◽