ELECTRO-OPTIC CHARACTERIZATION OF MICROWAVE STANDING WAVES IN A GaAs TRANSMISSION LINE BY USING A NOVEL PHASE ANALYZING TECHNIQUE

1998 ◽  
pp. 145-158
Author(s):  
CI-LING PAN ◽  
GONG-RU LIN ◽  
JIA-MIN SHIEH ◽  
CHIA-WEN TSAI ◽  
S.-c. WANG ◽  
...  
Keyword(s):  
Transmission Line ◽  
Standing Waves ◽  
Electro Optic

Electro-Optic Characterization of Microwave Standing Waves in a GaAs Transmission Line by Using a Novel Phase Analyzing Technique

1997 ◽  
Vol 08 (04) ◽  
pp. 719-732 ◽  
Author(s):  
Ci-Ling Pan ◽  
Gong-Ru Lin ◽  
Jia-Min Shieh ◽  
Chia-Wen Tsai ◽  
S.-C. Wang ◽  
...  
Keyword(s):  
Transmission Line ◽  
Standing Wave ◽  
Theoretical Models ◽  
Phase Lock Loop ◽  
Phase Component ◽  
Microstrip Transmission Line ◽  
Electro Optic ◽  
Wave Patterns ◽  
Good Agreement

We demonstrate an accurate, non-contact and compact characterization technique for measuring both the amplitude and phase component of microwave standing-wave patterns in a GaAs microstrip transmission line. A laser-diode-based optoelectronic phase lock loop was employed as a phase-referencing scheme. Key parameters such as voltage standing-wave ratio and reflection coefficient for a GaAs microstrip transmission line were determined up to 16 GHz. Dispersion charateristics were found in good agreement with selected theoretical models.

200-GHz bandwidth on wafer characterization of CMOS nonlinear transmission line using electro-optic sampling

2012 ◽  
Vol 54 (8) ◽  
pp. 1858-1862 ◽  
Author(s):  
M. Jamshidifar ◽  
G. Spickermann ◽  
H. Schäfer ◽  
P. Haring Bolivar
Keyword(s):  
Transmission Line ◽  
Nonlinear Transmission Line ◽  
Nonlinear Transmission ◽  
Electro Optic

Characterization of contact resistance of low-value resistor by transmission line model (TLM) method

2002 ◽  
Vol 85 (3) ◽  
pp. 16-22
Author(s):  
Kiichi Kamimura ◽  
Shinsuke Okada ◽  
Masato Nakao ◽  
Yoshiharu Onuma ◽  
Shozo Yamashita
Keyword(s):  
Contact Resistance ◽  
Transmission Line ◽  
Transmission Line Model ◽  
Line Model ◽  
Tlm Method

Characterization of amorphous-Si/1ML-Ge/Si(001) Interface Structure by X-ray Standing Waves

2003 ◽  
Vol 42 (Part 1, No. 11) ◽  
pp. 7050-7052 ◽  
Author(s):  
Shinichiro Nakatani ◽  
Kazushi Sumitani ◽  
Akinobu Nojima ◽  
Toshio Takahashi ◽  
Keiichi Hirano ◽  
...  
Keyword(s):  
Standing Waves ◽  
Interface Structure ◽  
X Ray ◽  
Amorphous Si

Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate

2014 ◽  
Author(s):  
Stefan Prorok ◽  
Marvin Schulz ◽  
Alexander Petrov ◽  
Manfred Eich ◽  
Jingdong Luo ◽  
...  
Keyword(s):  
Thin Films ◽  
Silicon Substrate ◽  
Polymer Thin Films ◽  
Electro Optic

Electro-Optic Sampler for Characterization of Devices in a Cryogenic Environment

1988 ◽  
pp. 1097-1104 ◽  
Author(s):  
Douglas R. Dykaar ◽  
Roman Sobolewski ◽  
James M. Chwalek ◽  
Thomas Y. Hsiang ◽  
Gerard A. Mourou
Keyword(s):  
Electro Optic

scholarly journals Design and Characterization of Traveling-wave Electrodes for InP-based Rectangular Mach-Zehnder High Speed Electro-optic Modulators

2017 ◽  
Vol 46 (5) ◽  
pp. 523002
Author(s):  
赵丽亚 ZHAO Li-ya ◽  
王乐 WANG Le ◽  
杨妍 YANG Yan ◽  
刘克 LIU Ke
Keyword(s):  
Traveling Wave ◽  
High Speed ◽  
Electro Optic

scholarly journals Optical loss characterization of SEO100C electro-optic polymer within single mode rib waveguides

OSA Continuum ◽  
2019 ◽  
Vol 2 (11) ◽  
pp. 3299
Author(s):  
Evan Gawron ◽  
Michael Maurer ◽  
Christopher Middlebrook ◽  
Kevin Kellar
Keyword(s):  
Optical Loss ◽  
Single Mode ◽  
Electro Optic ◽  
Rib Waveguides

An Innovative Use of TDR Probes: First Numerical Validations with a Coaxial Cable

2018 ◽  
Vol 23 (4) ◽  
pp. 437-442
Author(s):  
Raffaele Persico ◽  
Iman Farhat ◽  
Lourdes Farrugia ◽  
Sebastiano D'Amico ◽  
Charles Sammut
Keyword(s):  
Magnetic Properties ◽  
Transmission Line ◽  
Time Domain ◽  
Numerical Data ◽  
Time Domain Reflectometry ◽  
Coaxial Cable ◽  
Transmission Line Model ◽  
Properties Of Materials

In this paper we propose a study regarding some possibilities that can be offered by a time domain reflectometry (TDR) probe in retrieving both dielectric and magnetic properties of materials. This technique can be of interest for several applications, among which the characterization of soil in some situations. In particular, here we propose an extension of the paper “Retrieving electric and magnetic propetries of the soil in situ: New possibilities”, presented at the IWAGPR, held in Edinburgh in 2017, and as a new contribution we will validate a transmission line model with numerical data simulated by the CST code.

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