Youth and Politics in Democratic Argentina: Inventing Traditions, Creating New Trends (1983–2008)

Young ◽  
2012 ◽  
Vol 20 (4) ◽  
pp. 357-376 ◽  
Author(s):  
Mariana Chaves ◽  
Pedro Nuñez

This article has three objectives. First, to present the trajectories of youth studies, in particular about youth and politics, in Argentina from 1983 to 2008. This section is the centre of the article and it is organized in three axes, we will first show the link between the historical context and the possibility of research on youth, both for their appearance as objects of study and for the development of social sciences in Argentina. Then we will detail this background that constitutes what we call ‘the invention of tradition’, and we will pass on to a characterization of current tendencies in the field of youth studies and politics. The second objective is to present through a case study (participation in secondary schools) some discussions regarding the link between youth and politics. Finally, we will discuss youth and politics as an academic and societal preoccupation in the light of the aforementioned processes.

2018 ◽  
Vol 11 (1) ◽  
pp. 142-151
Author(s):  
Giuliana Bonifati

The current historical context is characterised by a significant change in the economic and social fields that have led to the development of the economy of creativity and knowledge. This condition has laid the basis for the rise of a new social class. This radical change in the productive paradigm has started a series of modifications to urban spaces, setting in place a rooted change in the fabric of the city.The objective of this paper is to understand and interpret the nature of the changes under way and to investigate how what occurred in economic and social fields influenced the processes of urban regeneration. Starting from a theoretical background it will examine the concept of creativity applied to economics and social sciences. Secondly, by identifying the urban environment of London as a case study, it will analyze single cases that will show the root of these practices within urban spaces. The purpose of it will be verified by the possibility of building urban transformation strategies that use creativity as the tool of change.


Author(s):  
D. L. Callahan

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.


2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  

Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.


Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.


Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.


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