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Modelling and characterisation of flat-band roll-off behaviours in LaOx capped high-K/metal-gate NMOSFET with 28 nm CMOS technology
International Journal of Nanotechnology
◽
10.1504/ijnt.2014.065129
◽
2014
◽
Vol 11
(12)
◽
pp. 1039
Author(s):
Wen Han Hung
◽
Feng Renn Juang
◽
Yean Kuen Fang
◽
Tzyy Ming Cheng
Keyword(s):
Cmos Technology
◽
Flat Band
◽
Metal Gate
◽
High K
◽
28 Nm
Download Full-text
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10.1049/el.2012.3443
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Novel Exploration of Flat-Band Voltage Manipulation by NPT for Advanced High-k/Metal-Gate CMOS Technology
ECS Meeting Abstracts
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10.1149/ma2019-01/23/1174
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Keyword(s):
Cmos Technology
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Flat Band
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Novel Exploration of Flat-Band Voltage Manipulation by Nitrogen Plasma Treatment for Advanced High-k/Metal-Gate CMOS Technology
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10.1149/08903.0055ecst
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Vol 89
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pp. 55-59
Author(s):
Jiaxin Yao
◽
Zhaozhao Hou
◽
Zhenhua Wu
◽
Huaxiang Yin
Keyword(s):
Plasma Treatment
◽
Cmos Technology
◽
Nitrogen Plasma
◽
Flat Band
◽
Flat Band Voltage
◽
Metal Gate
◽
High K
Download Full-text
RF power potential of High-k metal gate 28 nm CMOS technology
CAS 2013 (International Semiconductor Conference)
◽
10.1109/smicnd.2013.6688649
◽
2013
◽
Author(s):
R. Ouhachi
◽
A. Pottrain
◽
D. Ducatteau
◽
E. Okada
◽
C. Gaquiere
Keyword(s):
Cmos Technology
◽
Rf Power
◽
Metal Gate
◽
High K
◽
28 Nm
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A highly symmetrical 10 transistor 2-read/write dual-port static random access memory bitcell design in 28 nm high-k/metal-gate planar bulk CMOS technology
Japanese Journal of Applied Physics
◽
10.7567/jjap.57.04fb10
◽
2018
◽
Vol 57
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◽
pp. 04FB10
Author(s):
Yuichiro Ishii
◽
Miki Tanaka
◽
Makoto Yabuuchi
◽
Yohei Sawada
◽
Shinji Tanaka
◽
...
Keyword(s):
Random Access
◽
Random Access Memory
◽
Cmos Technology
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Static Random Access Memory
◽
Access Memory
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Metal Gate
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High K
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28 Nm
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Analysis of USJ Formation with Combined RTA/Laser Annealing Conditions for 28nm High-K/Metal Gate CMOS Technology Using Advanced TCAD for Process and Device Simulation
2012 International Silicon-Germanium Technology and Device Meeting (ISTDM)
◽
10.1109/istdm.2012.6222439
◽
2012
◽
Cited By ~ 1
Author(s):
E. M. Bazizi
◽
S. M. Pandey
◽
C. Wang
◽
I. Jiang
◽
S. Chu
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...
Keyword(s):
Laser Annealing
◽
Device Simulation
◽
Cmos Technology
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Metal Gate
◽
Annealing Conditions
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High K
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Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation
Solid-State Electronics
◽
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◽
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◽
Vol 115
◽
pp. 7-11
Author(s):
Tsung-Hsien Kao
◽
Shoou-Jinn Chang
◽
Yean-Kuen Fang
◽
Po-Chin Huang
◽
Bo-Chin Wang
◽
...
Keyword(s):
Low Frequency
◽
Frequency Noise
◽
Low Frequency Noise
◽
Metal Gate
◽
High K
◽
Technology Process
◽
28 Nm
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A 4.0 GHz 291 Mb Voltage-Scalable SRAM Design in a 32 nm High-k + Metal-Gate CMOS Technology With Integrated Power Management
IEEE Journal of Solid-State Circuits
◽
10.1109/jssc.2009.2034082
◽
2010
◽
Vol 45
(1)
◽
pp. 103-110
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Cited By ~ 32
Author(s):
Yih Wang
◽
Uddalak Bhattacharya
◽
Fatih Hamzaoglu
◽
Pramod Kolar
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Yong-Gee Ng
◽
...
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Power Management
◽
Cmos Technology
◽
Metal Gate
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High K
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Sram Design
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High performance FDSOI CMOS technology with metal gate and high-k
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Y.H. Kim
◽
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◽
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◽
Cmos Technology
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Metal Gate
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The Lanthanum oxide capping layer induced flat-band roll-off behaviors in high-κ/metal-gate NMOSFETs with 28nm CMOS technology
The 4th IEEE International NanoElectronics Conference
◽
10.1109/inec.2011.5991670
◽
2011
◽
Cited By ~ 1
Author(s):
Wen-Han Hung
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Yean-Kuen Fang
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◽
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Flat Band
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