Luminescent tomography of semiconductor materials

1995 ◽  
pp. 360-362
Keyword(s):  
Semiconductor Materials

Cathodoluminescence of Catalyst Crystallites

1982 ◽  
Vol 40 ◽  
pp. 664-665
Author(s):  
E.D. Boyes ◽  
P.L. Gai ◽  
D.B. Darby ◽  
C. Warwick
Keyword(s):  
Defect Density ◽  
Chemical Properties ◽  
Operating Conditions ◽  
Semiconductor Materials ◽  
Environmental Cell ◽  
High Resolution Structure ◽  
Commercially Important ◽  
Crystallographic Defects ◽  
Resolution Structure

The extended crystallographic defects introduced into some oxide catalysts under operating conditions may be a consequence and accommodation of the changes produced by the catalytic activity, rather than always being the origin of the reactivity. Operation without such defects has been established for the commercially important tellurium molybdate system. in addition it is clear that the point defect density and the electronic structure can both have a significant influence on the chemical properties and hence on the effectiveness (activity and selectivity) of the material as a catalyst. SEM/probe techniques more commonly applied to semiconductor materials, have been investigated to supplement the information obtained from in-situ environmental cell HVEM, ultra-high resolution structure imaging and more conventional AEM and EPMA chemical microanalysis.

Deriving ultrapure three-dimensional semiconductor materials under space vacuum conditions

2003 ◽  
Vol 8 (5-6) ◽  
pp. 30-32
Author(s):  
B.E. Paton ◽  
◽  
E.A. Asnis ◽  
S.P. Zabolotin ◽  
P.I. Baranskii ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Semiconductor Materials ◽  
Space Vacuum

Investigation of Photoelectric Converters Based on Different Semiconductor Materials

2018 ◽  
Vol 10 (4) ◽  
pp. 04023-1-04023-6 ◽  
Author(s):  
Yu. V. Natarova ◽  
◽  
A. B. Galat ◽  
A. S. Gnatenko ◽  
◽  
...  
Keyword(s):  
Semiconductor Materials ◽  
Photoelectric Converters
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