Grain Boundary Transformations in Bi-Doped Copper
Keyword(s):
ABSTRACTBismuth-induced grain boundary faceting in Cu-12 at ppm Bi polycrystals was studied using transmission electron microscopy (TEM). The population of faceted grain boundaries in samples aged at 600°C was observed to increase with heat treatment time from 15min to 24h; aging for 72h resulted in de-faceting, presumably due to loss of Bi from the specimen. The majority of completely faceted boundaries were found between grains with misorientation Σ=3. About 65% of the facets of these boundaries were found to lie parallel to crystal plane pairs of the type {111}1/{111]2- The significance of these findings in light of recent high resolution electron microscopy experiments is discussed.
1993 ◽
Vol 8
(5)
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pp. 1019-1027
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1997 ◽
Vol 76
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pp. 907-919
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2003 ◽
Vol 83
(36)
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pp. 4071-4082
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