Standing Wave Reflectivity in Photonic Structures Using a Scattering Type Optical Near-Field Optical Microscope

2003 ◽  
Vol 797 ◽  
Author(s):  
A. Bruyant ◽  
S. Aubert ◽  
G. Lérondel ◽  
S. Blaize ◽  
R. Bachelot ◽  
...  
Keyword(s):  
Fourier Analysis ◽  
Standing Wave ◽  
Near Field ◽  
Wave Pattern ◽  
Optical Microscope ◽  
Scanning Microscope ◽  
Reflectivity Spectrum ◽  
Optical Scanning ◽  
Photonic Structures ◽  
Straight Waveguide

ABSTRACTA method for measuring locally the normalised reflectivity spectrum in waveguiding photonic structures is presented. The latter is obtained by imaging the standing wave pattern upstream of the structure with a scattering type Scanning Near-field Optical Scanning Microscope (s-SNOM) and normalised with a simple Fourier analysis. Two kinds of sample are investigated. The first one is a corrugated integrated waveguide, the second is a fiber Bragg grating. The s-SNOM technique applied to waveguiding structures is first introduced with the case of a straight waveguide.

Local hysteresis loop measurements by magneto-optical scanning near-field optical microscope

2005 ◽  
Vol 98 (8) ◽  
pp. 086108 ◽  
Author(s):  
Jeroen Schoenmaker ◽  
Antonio Domingues dos Santos ◽  
Antonio Carlos Seabra ◽  
Yves Souche ◽  
Jean-Pierre Jamet ◽  
...  
Keyword(s):  
Hysteresis Loop ◽  
Near Field ◽  
Optical Microscope ◽  
Optical Scanning

Characterizing whispering-gallery modes in microspheres by direct observation of the optical standing-wave pattern in the near field

1996 ◽  
Vol 21 (10) ◽  
pp. 698 ◽  
Author(s):  
J. C. Knight ◽  
N. Dubreuil ◽  
V. Sandoghdar ◽  
J. Hare ◽  
V. Lefèvre-Seguin ◽  
...  
Keyword(s):  
Standing Wave ◽  
Direct Observation ◽  
Near Field ◽  
Wave Pattern ◽  
Whispering Gallery Modes ◽  
Whispering Gallery ◽  
Standing Wave Pattern

scholarly journals Simulation of Near Field Optical Scanning Microscope

2001 ◽  
Vol 121 (7) ◽  
pp. 1179-1186
Author(s):  
Yoshida Takahiro ◽  
Tanaka Kazuo ◽  
Tanaka Masahiro
Keyword(s):  
Near Field ◽  
Scanning Microscope ◽  
Optical Scanning

Analysis of light scattering from human breast tissue using a custom dual-optical scanning near-field optical microscope

2010 ◽  
Vol 4 (3) ◽  
pp. 193-205
Author(s):  
Jennifer Reiber Kyle ◽  
Michael D. Kyle ◽  
Ravi Raghavan ◽  
Gurer Budak ◽  
Cengiz S. Ozkan ◽  
...  
Keyword(s):  
Light Scattering ◽  
Breast Tissue ◽  
Near Field ◽  
Optical Microscope ◽  
Human Breast ◽  
Human Breast Tissue ◽  
Optical Scanning

Silver-coated near field optical scanning microscope probes fabricated by silver mirror reaction

2008 ◽  
Vol 92 (1) ◽  
pp. 49-52 ◽  
Author(s):  
S.Q. Wang ◽  
H. Zhao ◽  
Y. Wang ◽  
C.M. Li ◽  
Z.H. Chen ◽  
...  
Keyword(s):  
Near Field ◽  
Scanning Microscope ◽  
Optical Scanning ◽  
Silver Mirror ◽  
Silver Mirror Reaction

Chemical Etching Tip Processing for Magneto-Optical Scanning Near-Field Optical Microscopy

2005 ◽  
Vol 11 (S03) ◽  
pp. 18-21 ◽  
Author(s):  
J. Schoenmaker ◽  
M. Pojar ◽  
A. D. Barra-Barrera ◽  
A. C. Seabra ◽  
A. D. Santos
Keyword(s):  
Optical Fibers ◽  
Exchange Bias ◽  
Chemical Etching ◽  
Near Field ◽  
Optical Microscope ◽  
Magnetic Multilayers ◽  
Optical Scanning ◽  
Reliable Instrument ◽  
Microscopy Characterization

Nanoscale resolution in microscopy characterization has become crucial for state-of-the-art science and technology. We have developed a Magneto-optical Scanning Near-Field Optical Microscope (MO-SNOM), and it has demonstrated to be a powerful tool to study local magnetic properties [1,2]. One of the critical steps in producing a reliable instrument and consistent images is the fabrication of the microscope tip. This work presents concepts and results on tip processing by chemical etching on FS-SN-3224 optical fibers from 3M. The quality of the tips produced was tested on magnetic multilayers presenting exchange-bias coupling.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

scholarly journals Recent advances in characterizing the “bee” structures and asphaltene particles in asphalt binders

2020 ◽  
Vol 13 (6) ◽  
pp. 697-706
Author(s):  
Yuhong Wang ◽  
Kecheng Zhao ◽  
Fangjin Li ◽  
Qi Gao ◽  
King Wai Chiu Lai
Keyword(s):  
Near Field ◽  
Asphalt Binder ◽  
Optical Microscope ◽  
Asphalt Binders ◽  
Zero Shear Viscosity ◽  
Surface Features ◽  
Asphaltene Content ◽  
Scanning Transmission ◽  
Before And After ◽  
Binder Aging

AbstractThe microscopic surface features of asphalt binders are extensively reported in existing literature, but relatively fewer studies are performed on the morphology of asphaltene microstructures and cross-examination between the surface features and asphaltenes. This paper reports the findings of investigating six types of asphalt binders at the nanoscale, assisted with atomic force microscopy (AFM) and scanning transmission electron microscopy (STEM). The surface features of the asphalt binders were examined by using AFM before and after being repetitively peeled by a tape. Variations in infrared (IR) absorbance at the wavenumber around 1700 cm−1, which corresponds to ketones, were examined by using an infrared s-SNOM instrument (scattering-type scanning near-field optical microscope). Thin films of asphalt binders were examined by using STEM, and separate asphaltene particles were cross-examined by using both STEM and AFM. In addition, connections between the microstructures and binder’s physicochemical properties were evaluated. The use of both microscopy techniques provide comprehensive and complementary information on the microscopic nature of asphalt binders. It was found that the dynamic viscosities of asphalt binders are predominantly determined by the zero shear viscosity of the corresponding maltenes and asphaltene content. Limited samples also suggest that the unique bee structures are likely related to the growth of asphaltene content during asphalt binder aging process, but more asphalt binders from different crude sources are needed to verify this finding.

Sign in / Sign up

Export Citation Format

Share Document