scholarly journals Compensation of Measurement Uncertainty in a Remote Fetal Monitor

2020 ◽  
Vol 10 (9) ◽  
pp. 3274
Author(s):  
Sadot Arciniega-Montiel ◽  
Guillermo Ronquillo-Lomeli ◽  
Roberto Salas-Zúñiga ◽  
Tomás Salgado-Jiménez ◽  
Leonardo Barriga-Rodríguez
Keyword(s):  
Measurement Uncertainty ◽  
Medical Technology ◽  
Continuous Monitoring ◽  
Probabilistic Models ◽  
Reliable Operation ◽  
Characterization Of Properties ◽  
Very High ◽  
Fetal Monitor

The perinatal mortality rate is very high throughout the world. A fetal monitor may be used remotely, and this would tackle the problem of continuous monitoring of high-risk pregnancies. There is evidence that current technology is of low reliability, and, therefore, of low precision to identify fetal health. In medical technological implementation, a safe, efficient, and reliable operation must be guaranteed, and the main problem is that remote fetal monitor gathers just a few samples, so the hypothesis of classical theory is not met. We are proposing an approach that improves the data’s lack of reliability that accompanies the use of a remote fetal monitor. The method refers to how, by using the existing technologies and the initial experimental data, it is possible to apply probabilistic models that are truly representative of each application. This leads to the characterization of properties of the statistics used to generate a representative probabilistic model without the need to consider the hard suppositions. Results show that, for every case study, it was possible to improve estimations of measurement uncertainty. The proposed method is a useful tool to increase the reliability of medical technology, especially for pieces of equipment where a health care professional is not available.

Multiphysics characterization of reservoir prospects in the Hoop area of the Barents Sea

2018 ◽  
Vol 6 (3) ◽  
pp. SG1-SG17 ◽  
Author(s):  
Pedro Alvarez ◽  
Fanny Marcy ◽  
Mark Vrijlandt ◽  
Øyvind Skinnemoen ◽  
Lucy MacGregor ◽  
...  
Keyword(s):  
Barents Sea ◽  
Seismic Analysis ◽  
Rock Physics ◽  
High Resistivity ◽  
Well Log ◽  
The Barents Sea ◽  
Geophysical Measurement ◽  
Very High

The inherent nonuniqueness of geophysical analysis can mean that interpretations based only on a single geophysical measurement can be ambiguous or uncertain. We have developed a case study from the Hoop area of the Barents Sea, in which prestack seismic, well-log, and controlled-source electromagnetic (CSEM) data were integrated within a rock-physics framework to provide a more robust assessment of the prospectivity of the area than could be obtained by seismic analysis alone. In this example, although quantitative seismic interpretation identified potentially hydrocarbon-bearing sands, the saturation was uncertain. In this area and at shallow depths, the main focus is on (very) high oil saturations. Adding the CSEM data in this setting allows us to distinguish between high saturations ([Formula: see text]) and low and medium saturations ([Formula: see text]): It is clear that saturations similar to those observed at the nearby Wisting well ([Formula: see text]) are not present in this area. However, because of limitations on the sensitivity of the CSEM data in this high-resistivity environment, it is not possible to distinguish between low and medium saturations. This remains an uncertainty in the analysis. Based on the resulting downgrade of the main prospect Maya and the limited additional high-risk prospectivity at other stratigraphic levels, the partnership agreed to surrender the license.

Construction of plastic contact deformation maps on ceramics: a case study on aluminum nitride

1996 ◽  
Vol 54 ◽  
pp. 636-637
Author(s):  
D. L. Callahan
Keyword(s):  
Plastic Deformation ◽  
Aluminum Nitride ◽  
Mechanical Response ◽  
Three Dimensional ◽  
Bright Field Image ◽  
Perfectly Plastic ◽  
Contrast Analysis ◽  
Deformation Patterns

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.

Integrating The Geophysical Characterization Of Seismic Thin Beds With Stochastic Reservoir Modeling: A Case Study From The Kutei Basin (Offshore Kalimantan, Indonesia)

2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  
Keyword(s):  
Reservoir Modeling ◽  
Geophysical Characterization

Failure Analysis of CDM-ESD Damage in a GaAs RFIC

2000 ◽  
Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Integrated Circuit ◽  
Production Test ◽  
Analysis Techniques ◽  
Device Model ◽  
Charged Device ◽  
Subsequent Failure

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.

dC/dV and CV Characterization of Gate Resistance Defects in eDRAM Circuits

2013 ◽  
Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney
Keyword(s):  
Deep Submicron ◽  
Work Flow ◽  
Localization Technique ◽  
Characterization Techniques ◽  
Capacitance Voltage ◽  
Gate Resistance

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.

Case Study and Fault Modeling for Wrong Redundancy Evaluation on DRAM Devices

2007 ◽  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel
Keyword(s):  
Failure Mode ◽  
Failure Modes ◽  
Fault Modeling ◽  
Mode Analysis ◽  
Root Cause ◽  
Failure Mode Analysis

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.

Ionized gas kinematics and luminosity profiles of Low-z Lyman Alpha Blobs

2019 ◽  
Vol 15 (S359) ◽  
pp. 413-414
Author(s):  
María P. Agüero ◽  
Rubén Díaz ◽  
Mischa Schirmer
Keyword(s):  
Emission Line ◽  
Galactic Nuclei ◽  
Host Galaxies ◽  
Ionized Gas ◽  
Lyman Alpha ◽  
Gas Kinematics ◽  
The Universe ◽  
Very High ◽  
The Continuum

AbstractThis work is focused on the characterization of the Seyfert-2 galaxies hosting very large, ultra-luminous narrow-line regions (NLRs) at redshifts z = 0.2−0.34. With a space density of 4.4 Gcp−3 at z ∼ 0.3, these “Low Redshift Lyman-α Blob” (LAB) host galaxies are amongst the rarest objects in the universe, and represent an exceptional and short-lived phenomenon in the life cycle of active galactic nuclei (AGNs). We present the study of GMOS spectra for 13 LAB galaxies covering the rest frame spectral range 3700–6700 Å. Predominantly, the [OIII]λ5007 emission line radial distribution is as widespread as that of the continuum one. The emission line profiles exhibit FWHM between 300–700 Km s−1. In 7 of 13 cases a broad kinematical component is detected with FWHM within the range 600–1100 Km s−1. The exceptionally high [OIII]λ5007 luminosity is responsible for very high equivalent width reaching 1500 Å at the nucleus.

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