Theory and Applications of a High-Resolution Synthetic Acoustic Antenna for Industrial Noise Measurements

1984 ◽  
Vol 23 (2) ◽  
pp. 60 ◽  
Author(s):  
Marinus M. Boone ◽  
A.J. Berkhout
Keyword(s):  
High Resolution ◽  
Industrial Noise ◽  
Noise Measurements ◽  
Acoustic Antenna

Homemade-HEMT-based transimpedance amplifier for high-resolution shot-noise measurements

2021 ◽  
Vol 92 (12) ◽  
pp. 124712
Author(s):  
Takase Shimizu ◽  
Masayuki Hashisaka ◽  
Heorhii Bohuslavskyi ◽  
Takafumi Akiho ◽  
Norio Kumada ◽  
...  
Keyword(s):  
High Resolution ◽  
Shot Noise ◽  
Transimpedance Amplifier ◽  
Noise Measurements

Electromigration Damage Studied by 1/f Noise

1996 ◽  
Vol 428 ◽  
Author(s):  
K. Dagge
Keyword(s):  
High Resolution ◽  
Spectral Density ◽  
Nucleation And Growth ◽  
Polycrystalline Aluminum ◽  
Noise Component ◽  
Aluminum Films ◽  
Before And After ◽  
Noise Measurements ◽  
Thin Polycrystalline ◽  
Dc Stress

AbstractThin polycrystalline aluminum films were investigated by high-resolution ac noisemeasurements before and after damaging by high direct current. Immediately after the interruption of the dc-stress a transient noise component was observed that was inversely proportional to the square of the frequency f (1/f2 -noise). It was caused by discrete jumps in the resistance presumably due to the relaxation of mechanical stress. The second component of noise was stable and in all cases approximately proportional to 1/f. The spectral density of 1/f-noise showed characteristic discrete steps as a function of damaging time, in contrast to the resistance which increased almost continuously up to the failure of the film. This indicates that nucleation-and-growth processes of mobile defects were observed in the noise measurements. Thus noise measurements might help to understand the microscopic process of electromigration.

Acoustic resonance techniques for temperature, stress and impurity characterization in piezoelectric materials

1986 ◽  
Vol 320 (1554) ◽  
pp. 171-180 ◽  
Keyword(s):  
High Resolution ◽  
Piezoelectric Materials ◽  
Acoustic Resonance ◽  
Temperature Gradients ◽  
Small Temperature ◽  
Noise Measurements ◽  
Piezoelectric Coupling ◽  
Ionic Impurities ◽  
Coupling Frequency ◽  
Resonant Method

The resonance frequency of a vibrating structure is sensitive to thermal, mechanical, or electrical perturbations. On account of the high resolution allowed by frequency measurements, very small temperature gradients and stresses can be detected and measured in piezoelectric, and mainly in quartz resonators. Because of piezoelectric coupling, frequency is also sensitive to the relaxation of ionic impurities. The resonant method gives access to the nature and the concentration of the impurities. The interactions between thermal phonons also are characterized, by means of noise measurements and some interpretation of the mechanisms of 1/ f noise will be presented.

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