Very Low EOT in Ge MOS Devices with High Oxidation State Interfacial Layer
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2014 ◽
Vol 35
(5)
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pp. 509-511
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2007 ◽
Vol 129
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pp. 16278-16278
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1997 ◽
Vol 69
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pp. 2197-2204
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pp. 1447-1454
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1991 ◽
Vol 190
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pp. 231-235
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