phase measuring profilometry
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2021 ◽  
Vol 11 (6) ◽  
pp. 2536
Author(s):  
Chaozhi Yang ◽  
Yiping Cao ◽  
Xiuzhang Huang

In this paper, we propose a new single-shot three-dimensional (3D) measuring method based on quaternary grating projection. In traditional binary grating phase measuring profilometry (PMP), a multi-step or color fringe pattern are usually used to extract the sinusoidal fringes. In our proposed method, by using the DLP4500’s 2-bit gray coding mode, the grayscale is quaternary. The three non-zero grayscales cyclically arranged in equal width, and the fourth grey value is 0 which is not encoded in the fringe pattern but represents the shadow information in the deformed pattern, where a quaternary grating is encoded. When the DLP4500 projects the quaternary grating onto the measured object, the charge coupled device (CCD) captures the corresponding deformed pattern synchronously. Three frames of binary deformed patterns with 1/3 duty cycle and a relative displacement of 1/3 period can be decomposed by the segmentation algorithm proposed in this paper. Three sinusoidal deformed patterns with a 2π/3 shift-phase can be obtained by extracting the fundamental frequency of the three binary deformed patterns correspondingly, and the 3D shape of the object can be reconstructed by PMP. Experimental results show the effectiveness and feasibility of the proposed method. Because the DLP4500 only needs 2-bit coded grating for projection, the refresh rate of the projected grating is as high as 1428 Hz, which will have a broad application prospect in real time and fast online measurement.


2021 ◽  
Vol 60 (02) ◽  
Author(s):  
Lei Cui ◽  
Guoying Feng ◽  
Hongru Li ◽  
Han Yuan ◽  
Zhongyi Bao

2021 ◽  
Vol 19 (10) ◽  
pp. 101201
Author(s):  
Xin Yu ◽  
Shanshan Lai ◽  
Yuankun Liu ◽  
Wenjing Chen ◽  
Junpeng Xue ◽  
...  

2020 ◽  
Vol 477 ◽  
pp. 126343
Author(s):  
Haihua An ◽  
Yiping Cao ◽  
Hongmei Li ◽  
Jin Chen ◽  
Na Yang

2020 ◽  
Vol 20 (20) ◽  
pp. 12423-12434
Author(s):  
Yinfei Pan ◽  
Duanmao Liu ◽  
Rongsheng Lu

2020 ◽  
Vol 59 (08) ◽  
pp. 1
Author(s):  
Zhongyi Bao ◽  
Hongru Li ◽  
Han Yuan ◽  
Lei Cui ◽  
Shouhuan Zhou

2020 ◽  
Vol 62 (5) ◽  
pp. 256-263
Author(s):  
Xiaxia Zhao ◽  
Rong Mo ◽  
Zhiyong Chang ◽  
Jin Lu

Phase-measuring profilometry (PMP) is an important technique for image analysis in optical non-destructive testing (NDT). Its measurement accuracy is significantly affected by gamma distortion in the projector, which makes the projected sinusoidal fringe patterns non-sinusoidal. In order to address this issue, a generic gamma non-linearity model based on constant-intensity images is proposed in this paper. In the proposed model, system defocus and noise are considered and analysed. It is demonstrated through theoretical derivation that the constant-intensity images remain unchanged, with no additional frequency being produced. For this reason, system defocus is not modelled in the proposed gamma calibration model and the related defocus parameters need not be calculated, which reduces the complexity of the calculation. Any noise that exists in the optical measurement system is another main factor influencing the greyscale levels of the image. A mutual information (MI)-based denoising method is proposed to reduce the noise and improve the accuracy of the gamma calibration. Furthermore, with the defocus analysis and the noise reducing method, a robust pixel-wise gamma calibration method is introduced. The experimental results in this paper show that the proposed gamma calibration method is able to accurately calibrate the gamma non-linearity of the system. Moreover, the phase precision is significantly improved and a higher quality measurement is achieved for the measured surfaces.


2020 ◽  
Vol 59 (2) ◽  
pp. 389
Author(s):  
Mingyou Dai ◽  
Kuang Peng ◽  
Man Luo ◽  
Jiang Zhao ◽  
Wenfeng Wang ◽  
...  

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