Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media

X-ray computed micro-tomography typically involves a trade-off between sample size and resolution, complicating the study at a micrometer scale of representative volumes of materials with broad feature size distributions (e.g. natural stones). X-ray dark-field tomography exploits scattering to probe sub-resolution features, promising to overcome this trade-off. In this work, we present a quantification method for sub-resolution feature sizes using dark-field tomograms obtained by tuning the autocorrelation length of a Talbot grating interferometer. Alumina particles with different nominal pore sizes (50 nm and 150 nm) were mixed and imaged at the TOMCAT beamline of the SLS synchrotron (PSI) at eighteen correlation lengths, covering the pore size range. The different particles cannot be distinguished by traditional absorption µCT due to their very similar density and the pores being unresolved at typical image resolutions. Nevertheless, by exploiting the scattering behavior of the samples, the proposed analysis method allowed to quantify the nominal pore sizes of individual particles. The robustness of this quantification was proven by reproducing the experiment with solid samples of alumina, and alumina particles that were kept separated. Our findings demonstrate the possibility to calibrate dark-field image analysis to quantify sub-resolution feature sizes, allowing multi-scale analyses of heterogeneous materials without subsampling.

Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media

X-ray computed micro-tomography typically involves a trade-off between sample size and resolution, complicating the study at a micrometer scale of representative volumes of materials with broad feature size distributions (e.g. natural stones). X-ray dark-field tomography exploits scattering to probe sub-resolution features, promising to overcome this trade-off. In this work, we present a quantification method for sub-resolution feature sizes using dark-field tomograms obtained by tuning the autocorrelation length of a Talbot grating interferometer. Alumina particles with different nominal pore sizes (50 nm and 150 nm) were mixed and imaged at the TOMCAT beamline of the SLS synchrotron (PSI) at eighteen correlation lengths, covering the pore size range. The different particles cannot be distinguished by traditional absorption µCT due to their very similar density and the pores being unresolved at typical image resolutions. Nevertheless, by exploiting the scattering behavior of the samples, the proposed analysis method allowed to quantify the nominal pore sizes of individual particles. The robustness of this quantification was proven by reproducing the experiment with solid samples of alumina, and alumina particles that were kept separated. Our findings demonstrate the possibility to calibrate dark-field image analysis to quantify sub-resolution feature sizes, allowing multi-scale analyses of heterogeneous materials without subsampling.

Fast Dark Signal Measurements of SVOM VT CCDs Using the Vertical Gradient of Dark Field Images

This paper describes a fast technique for estimating the dark signals of the charge coupled devices (CCDs) of the visible telescope (VT) onboard the space multi-band variable object monitor (SVOM). It is based on the vertical gradient in the dark field images of the frame transfer CCDs. During the process of frame clear, exposure, frame transfer and readout, the characteristic of dark signal accumulation is analyzed firstly. Next, the linear fitting method is used to fit the signal level of the dark field image in the vertical direction, and the slope of the fitting line represents the dark signal factor. This technique only needs one dark field image and can be used for simple and efficient dark signal measurements of frame transfer CCDs. Besides, an experiment of detecting dark signals as a function of temperature based on the fast technique has been carried out. Making use of the Shockley-Hall-Read theory, two curve fitting formulas are adopted to the experimental results for VT Advanced Inverted Mode Operation (AIMO) CCD and VT Non-Inverted Mode Operation (NIMO) CCD respectively. The experimental results and the formulas are used to determine the optimal on-orbit cooling temperature of VT CCDs.

The new neutron grating interferometer at the ANTARES beamline: design, principles and applications

Neutron grating interferometry is an advanced method in neutron imaging that allows the simultaneous recording of the transmission, the differential phase and the dark-field image. The latter in particular has recently been the subject of much interest because of its unique contrast mechanism which marks ultra-small-angle neutron scattering within the sample. Hence, in neutron grating interferometry, an imaging contrast is generated by scattering of neutrons off micrometre-sized inhomogeneities. Although the scatterer cannot be resolved, it leads to a measurable local decoherence of the beam. Here, a report is given on the design considerations, principles and applications of a new neutron grating interferometer which has recently been implemented at the ANTARES beamline at the Heinz Maier-Leibnitz Zentrum. Its highly flexible design allows users to perform experiments such as directional and quantitative dark-field imaging which provide spatially resolved information on the anisotropy and shape of the microstructure of the sample. A comprehensive overview of the neutron grating interferometer principle is given, followed by theoretical considerations to optimize the setup performance for different applications. Furthermore, an extensive characterization of the setup is presented and its abilities are demonstrated using selected case studies: (i) dark-field imaging for material differentiation, (ii) directional dark-field imaging to mark and quantify micrometre anisotropies within the sample, and (iii) quantitative dark-field imaging, providing additional size information on the sample's microstructure by probing its autocorrelation function.