Fabrication of YBa2Cu3O7-δ Superconducting Film on NiW Alloy Using Electrophoretic Deposition

This work reported on exploring a low cost preparation technology for coated conductor. The epitaxial of La0.4Sr0.6TiO3 conductive buffer layer on NiW substrate was achieved by metal organic deposition. Excellent in-plane and out of plane alignment is confirmed via XRD. YBCO film was fabricated by electrophoretic deposition (EPD). We used buffered (LSTO) Ni-W substrate and Ni plate as cathode and anode respectively. The critical current density of YBCO coating is more than 1000A/cm2 (0T, 77K).

Reel-to-Reel Processing of Buffer Layers and YBCO on Textured Substrate

High Tc superconducting tapes based on YBCO Coated Conductor have been extensively studied to develop the processing techniques for application. In this paper, two self-designed reel-to-reel deposition systems (Sputtering and PLD) were installed. Continuous deposition of multi-layer CeO2/YSZ/Y2O3 buffer layers were carried out on biaxially textured NiW substrate using reactive sputtering. YBCO films were coated on the CeO2/YSZ/Y2O3 buffered NiW substrate by continuous PLD subsequently. To achieve high current carrying capacities, combinations of various deposition conditions were explored. X-ray diffraction measurements show good in-plane and out-plane texture in buffer layers and YBCO films. The transition temperature of the YBCO was 89 K and the critical current is over 50 A at 77 K in 1 meter long YBCO tapes.

SURFACE MORPHOLOGY AND MICROSTRUCTURE OF DIRECT CURRENT SPUTTERING GROWTH OF BUFFER LAYERS FOR YBCO COATED CONDUCTOR

A composite buffer of CeO 2/ YSZ / Y 2 O 3 was investigated on the biaxially textured NiW long tape for YBCO coated conductor with magnetron sputtering technique. Every layer's surface morphology was observed by scanning electron microscopy. The seed layer Y 2 O 3 film was full coverage of the NiW substrate. The cap layer CeO 2 showed a smooth and crack-free surface and good crystallinity. The roughness of CeO 2 surface was measured by atom force microscopy. The transmission electron microscopy was used to analyze the cross-section of buffer layers and YBCO layer.