SURFACE MORPHOLOGY AND MICROSTRUCTURE OF DIRECT CURRENT SPUTTERING GROWTH OF BUFFER LAYERS FOR YBCO COATED CONDUCTOR
2007 ◽
Vol 21
(18n19)
◽
pp. 3348-3351
Keyword(s):
A composite buffer of CeO 2/ YSZ / Y 2 O 3 was investigated on the biaxially textured NiW long tape for YBCO coated conductor with magnetron sputtering technique. Every layer's surface morphology was observed by scanning electron microscopy. The seed layer Y 2 O 3 film was full coverage of the NiW substrate. The cap layer CeO 2 showed a smooth and crack-free surface and good crystallinity. The roughness of CeO 2 surface was measured by atom force microscopy. The transmission electron microscopy was used to analyze the cross-section of buffer layers and YBCO layer.
2005 ◽
Vol 426-431
◽
pp. 1056-1061
◽
2000 ◽
Vol 07
(05n06)
◽
pp. 565-570
◽
Keyword(s):
2004 ◽
Vol 412-414
◽
pp. 813-818
◽
2004 ◽
Vol 19
(6)
◽
pp. 1869-1875
◽
1990 ◽
Vol 48
(4)
◽
pp. 668-669
Keyword(s):
2021 ◽
pp. 1759-1829