2016 IEEE International Test Conference (ITC)
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70
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9
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Published By IEEE

9781467387736
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Diagnostic resolution improvement through learning-guided physical failure analysis

2016 ◽  
Author(s):  
Carlston Lim ◽  
Yang Xue ◽  
Xin Li ◽  
Ronald D. Blanton ◽  
M. Enamul Amyeen
Keyword(s):  
Failure Analysis ◽  
Resolution Improvement ◽  
Diagnostic Resolution

scholarly journals Cross-layer system reliability assessment framework for hardware faults

2016 ◽  
Author(s):  
A. Vallero ◽  
A. Savino ◽  
G. Politano ◽  
S. Di Carlo ◽  
A. Chatzidimitriou ◽  
...  
Keyword(s):  
System Reliability ◽  
Reliability Assessment ◽  
Cross Layer ◽  
Assessment Framework ◽  
Layer System ◽  
Hardware Faults

Logic characterization vehicle design reflection via layout rewiring

2016 ◽  
Author(s):  
Phillip Fynan ◽  
Zeye Liu ◽  
Benjamin Niewenhuis ◽  
Soumya Mittal ◽  
Marcin Strajwas ◽  
...  
Keyword(s):  
Vehicle Design

RF test accuracy and capacity enhancement on ATE for silicon TV tuners

2016 ◽  
Author(s):  
Y. Fan ◽  
A. Verma ◽  
Y. Su ◽  
L. Rose ◽  
J. Janney ◽  
...  
Keyword(s):  
Test Accuracy ◽  
Rf Test ◽  
Capacity Enhancement

Recycled FPGA detection using exhaustive LUT path delay characterization

2016 ◽  
Author(s):  
Md Mahbub Alam ◽  
Mark Tehranipoor ◽  
Domenic Forte
Keyword(s):  
Path Delay

Automated measurement of defect tolerance in mixed-signal ICs

2016 ◽  
Author(s):  
Stephen Sunter ◽  
Alessandro Valerio ◽  
Riccardo Miglierina
Keyword(s):  
Automated Measurement ◽  
Defect Tolerance ◽  
Mixed Signal
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