Optical Measurement Systems for Industrial Inspection XII
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 67)

H-INDEX

(FIVE YEARS 0)

Published By SPIE

9781510643987, 9781510643994

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Front Matter: Volume 11782

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2603216 ◽

2021 ◽

Keyword(s):

Matter Volume

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Optical sociology: how organizational culture impacts advances in optical metrology

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2596985 ◽

2021 ◽

Author(s):

Peter J. de Groot

Keyword(s):

Organizational Culture ◽

Optical Metrology

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Speckle simulation tool for the design of laser-based displacement sensors

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2592596 ◽

2021 ◽

Author(s):

Ernst Csencsics ◽

Tobias Wolf ◽

Georg Schitter

Keyword(s):

Simulation Tool ◽

Displacement Sensors

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Towards a continuous frequency band chirp material measure for surface topography measuring instrument calibration

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2591935 ◽

2021 ◽

Author(s):

Matthias Eifler ◽

Julian Hering ◽

Andrej Keksel ◽

Georg von Freymann ◽

Jörg Seewig

Keyword(s):

Surface Topography ◽

Frequency Band ◽

Measuring Instrument ◽

Instrument Calibration ◽

Continuous Frequency ◽

Material Measure

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High-speed electronic speckle pattern interferometry for analysis of thermo-mechanical behavior of electronic components

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2592024 ◽

2021 ◽

Author(s):

Gennadii Laskin ◽

Haosu Huai ◽

Markus Fratz ◽

Tobias Seyler ◽

Tobias Beckmann ◽

...

Keyword(s):

Mechanical Behavior ◽

High Speed ◽

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Electronic Components

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Optical parameter measurement of parallel plates based on weighted multi-step phase-shifting algorithm

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2593687 ◽

2021 ◽

Author(s):

Renhui Guo ◽

Pingping Song ◽

Chengxing Liu ◽

Xin Yang ◽

Zhiyao Yin

Keyword(s):

Optical Parameter ◽

Phase Shifting ◽

Parameter Measurement ◽

Parallel Plates

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Electro-optical measuring system for investigating the reflection-supressing properties of novel nanosurfaces

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2592406 ◽

2021 ◽

Author(s):

Malte Nickel ◽

Ubbo Ricklefs ◽

Jochen Frey

Keyword(s):

Measuring System ◽

Optical Measuring

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Three-dimensional measurement using a shape from focus method applied on a context of structured light profilometry

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2592331 ◽

2021 ◽

Author(s):

Xiangjun Kong ◽

Erwan Dupont ◽

Al Hajjar Hani ◽

Frédéric Lamarque

Keyword(s):

Structured Light ◽

Three Dimensional ◽

Dimensional Measurement ◽

Three Dimensional Measurement ◽

Shape From Focus

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Analysis of resolution enhancement through microsphere-assisted interferometry in the 3D spatial frequency domain

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2593296 ◽

2021 ◽

Author(s):

Lucie Hueser ◽

Peter Lehmann

Keyword(s):

Spatial Frequency ◽

Frequency Domain ◽

Resolution Enhancement ◽

Spatial Frequency Domain

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Analyzing real-time capability of raw laser-Doppler vibrometer signal combination for signal diversity

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2592048 ◽

2021 ◽

Author(s):

Marvin Schewe ◽

Christian Rembe

Keyword(s):

Real Time ◽

Laser Doppler Vibrometer ◽

Laser Doppler ◽

Signal Combination ◽

Signal Diversity

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Optical Measurement Systems for Industrial Inspection XIILatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By SPIE

Front Matter: Volume 11782

Optical sociology: how organizational culture impacts advances in optical metrology

Speckle simulation tool for the design of laser-based displacement sensors

Towards a continuous frequency band chirp material measure for surface topography measuring instrument calibration

High-speed electronic speckle pattern interferometry for analysis of thermo-mechanical behavior of electronic components

Optical parameter measurement of parallel plates based on weighted multi-step phase-shifting algorithm

Electro-optical measuring system for investigating the reflection-supressing properties of novel nanosurfaces

Three-dimensional measurement using a shape from focus method applied on a context of structured light profilometry

Analysis of resolution enhancement through microsphere-assisted interferometry in the 3D spatial frequency domain

Analyzing real-time capability of raw laser-Doppler vibrometer signal combination for signal diversity

Optical Measurement Systems for Industrial Inspection XII
Latest Publications