Noise in Nanoscale Semiconductor Devices
Latest Publications

TOTAL DOCUMENTS

20

(FIVE YEARS 20)

H-INDEX

1

(FIVE YEARS 1)

Published By Springer International Publishing

9783030374990, 9783030375003

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_7 ◽

2020 ◽

pp. 229-257

Author(s):

Bernhard Stampfer ◽

Alexander Grill ◽

Michael Waltl

Keyword(s):

Electrical Characterization ◽

Oxide Defects

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Defect-Based Compact Modeling of Random Telegraph Noise

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_16 ◽

2020 ◽

pp. 517-552

Author(s):

Pieter Weckx ◽

Ben Kaczer ◽

Marko Simicic ◽

Bertrand Parvais ◽

Dimitri Linten

Keyword(s):

Compact Modeling ◽

Random Telegraph Noise ◽

Telegraph Noise

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Origins of 1/f Noise in Electronic Materials and Devices: A Historical Perspective

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_1 ◽

2020 ◽

pp. 1-31

Author(s):

D. M. Fleetwood

Keyword(s):

Historical Perspective ◽

Electronic Materials

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Random Telegraph Noise in Flash Memories

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_6 ◽

2020 ◽

pp. 201-227

Author(s):

Alessandro S. Spinelli ◽

Christian Monzio Compagnoni ◽

Andrea L. Lacaita

Keyword(s):

Flash Memories ◽

Random Telegraph Noise ◽

Telegraph Noise

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Noise in Resistive Random Access Memory Devices

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_3 ◽

2020 ◽

pp. 87-133

Author(s):

F. M. Puglisi

Keyword(s):

Random Access ◽

Random Access Memory ◽

Resistive Random Access Memory ◽

Memory Devices ◽

Access Memory

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Oxide Trap-Induced RTS in MOSFETs

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_17 ◽

2020 ◽

pp. 553-607

Author(s):

A. S. M. Shamsur Rouf ◽

Zeynep Çelik-Butler

Keyword(s):

Oxide Trap

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Low-Frequency Noise in III–V, Ge, and 2D Transistors

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_10 ◽

2020 ◽

pp. 335-357

Author(s):

Mengwei Si ◽

Xuefei Li ◽

Wangran Wu ◽

Sami Alghamdi ◽

Peide Ye

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise

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Systematic Characterization of Random Telegraph Noise and Its Dependence with Magnetic Fields in MOSFET Devices

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_4 ◽

2020 ◽

pp. 135-174

Author(s):

Carlos Marquez ◽

Oscar Huerta ◽

Adrian I. Tec-Chim ◽

Fernando Guarin ◽

Edmundo A. Gutierrez-D ◽

...

Keyword(s):

Magnetic Fields ◽

Random Telegraph Noise ◽

Telegraph Noise

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An Overview on Statistical Modeling of Random Telegraph Noise in the Frequency Domain

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_15 ◽

2020 ◽

pp. 495-516

Author(s):

Thiago H. Both ◽

Maurício Banaszeski da Silva ◽

Gilson I. Wirth ◽

Hans P. Tuinhout ◽

Adrie Zegers-van Duijnhoven ◽

...

Keyword(s):

Frequency Domain ◽

Statistical Modeling ◽

Random Telegraph Noise ◽

Telegraph Noise

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Random Telegraph Noise Under Switching Operation

Noise in Nanoscale Semiconductor Devices ◽

10.1007/978-3-030-37500-3_9 ◽

2020 ◽

pp. 285-333

Author(s):

Kazutoshi Kobayashi ◽

Mahfuzul Islam ◽

Takashi Matsumoto ◽

Ryo Kishida

Keyword(s):

Switching Operation ◽

Random Telegraph Noise ◽

Telegraph Noise

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