2011 IEEE International Test Conference
Latest Publications

TOTAL DOCUMENTS

76

(FIVE YEARS 0)

H-INDEX

12

(FIVE YEARS 0)

Published By IEEE

9781457701528, 9781457701535, 9781457701511

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

ITC 2011 most significant paper award

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139191 ◽

2011 ◽

Keyword(s):

Paper Award

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Optimal manufacturing flow to determine minumum operating voltage

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139169 ◽

2011 ◽

Cited By ~ 4

Author(s):

Sreejit Chakravarty ◽

Binh Dang ◽

Darcy Escovedo ◽

A. J. Haas

Keyword(s):

Operating Voltage

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Investigation into voltage and process variation-aware manufacturing test

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139138 ◽

2011 ◽

Cited By ~ 2

Author(s):

Urban Ingelsson ◽

Bashir M. Al-Hashimi

Keyword(s):

Process Variation ◽

Manufacturing Test

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Title page

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139201 ◽

2011 ◽

Keyword(s):

Title Page

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Analyzing ATE interconnect performance for serial links of 10 Gbps and above

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139158 ◽

2011 ◽

Cited By ~ 1

Author(s):

Mitchell Lin ◽

Tyler Tolman

Keyword(s):

Serial Links

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TTTC: Test technology technical council

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139199 ◽

2011 ◽

Keyword(s):

Technical Council ◽

Test Technology

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Test clock domain optimization for peak power supply noise reduction during scan

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139163 ◽

2011 ◽

Cited By ~ 2

Author(s):

Jen-Yang Wen ◽

Yu-Chuan Huang ◽

Min-Hong Tsai ◽

Kuan-Yu Liao ◽

James C.-M. Li ◽

...

Keyword(s):

Noise Reduction ◽

Power Supply ◽

Peak Power ◽

Power Supply Noise ◽

Domain Optimization ◽

Supply Noise

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Author index

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139182 ◽

2011 ◽

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A fully cell-based design for timing measurement of memory

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139150 ◽

2011 ◽

Cited By ~ 5

Author(s):

Yi-Chung Chang ◽

Shi-Yu Huang ◽

Chao-Wen Tzeng ◽

Jack Yao

Keyword(s):

Timing Measurement

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ITC 2010 paper awards

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139184 ◽

2011 ◽

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