2020 IEEE European Test Symposium (ETS)
Latest Publications

TOTAL DOCUMENTS

51
(FIVE YEARS 51)

H-INDEX

2
(FIVE YEARS 2)

Published By IEEE

9781728143125
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

scholarly journals Modeling Static Noise Margin for FinFET based SRAM PUFs

2020 ◽  
Author(s):  
Shayesteh Masoumian ◽  
Georgios Selimis ◽  
Roel Maes ◽  
Geert-Jan Schrijen ◽  
Said Hamdioui ◽  
...  
Keyword(s):  
Static Noise Margin ◽  
Noise Margin ◽  
Static Noise

Anomaly Detection in Embedded Systems Using Power and Memory Side Channels

2020 ◽  
Author(s):  
Jiho Park ◽  
Virinchi Roy Surabhi ◽  
Prashanth Krishnamurthy ◽  
Siddharth Garg ◽  
Ramesh Karri ◽  
...  
Keyword(s):  
Embedded Systems ◽  
Anomaly Detection ◽  
Side Channels

scholarly journals Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism

2020 ◽  
Author(s):  
Mohamed Elshamy ◽  
Giorgio Di Natale ◽  
Antonios Pavlidis ◽  
Marie-Minerve Louerat ◽  
Haralampos-G. Stratigopoulos
Keyword(s):  
Hardware Trojan ◽  
Mixed Signal ◽  
Test Access Mechanism

Detection of Rowhammer Attacks in SoCs with FPGAs

2020 ◽  
Author(s):  
Rana Elnaggar ◽  
Siyuan Chen ◽  
Peilin Song ◽  
Krishnendu Chakrabarty
Load More ...
Sign in / Sign up

Export Citation Format

Share Document